arXiv Machine Learning By Yonghan Shin, Won-Ki Jeong

LRMIL: Efficient Low-Resolution Multiple Instance Learning via High-Resolution Knowledge Distillation for Whole Slide Image Classification

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arXiv:2606. 06864v1 Announce Type: cross Abstract: Multiple instance learning (MIL) has become a standard paradigm for whole slide image (WSI) analysis in digital pathology, as it enables slide-level prediction without dense annotations.

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arXiv Computer Vision
Aug 25

LanGuSTE: Language-Guided Coarse-to-Fine Patch Selection for Efficient Whole Slide Image Analysis

LanGuSTE is a patch‑selection framework for whole slide image analysis that uses vision‑language models and large language model knowledge. It introduces Cross‑Scale Visual Prompt Tuning to align low‑resolution and high‑resolution patches, and a coarse‑to‑fine selection module that encodes only informative high‑resolution patches. Experiments show LanGuSTE cuts overall processing time to about one‑third of the baseline while matching or surpassing diagnostic performance of exhaustive and state‑of‑the‑art methods.

By Yonghan Shin, Gangsu Kim, Won-Ki Jeong
arXiv Computer Vision
6d ago

LadderMIL: Multiple Instance Learning with Coarse-to-Fine Self-Distillation

arXiv:2502.02707v5 Announce Type: replace Abstract: Multiple Instance Learning (MIL) for whole slide image (WSI) analysis in computational pathology often neglects instance-level learning as supervis...

By Shuyang Wu, Yifu Qiu, Ines P. Nearchou, Sandrine Prost, Jonathan A. Fallowfield, Hideki Ueno, Hitoshi Tsuda, David J. Harrison, Hakan Bilen, Timothy J. Kendall
arXiv Computer Vision
Sep 3

AtlasPatch: Scalable Foundation Model-based Tissue Detection and Patch Extraction for Computational Pathology

AtlasPatch is a scalable, high‑throughput whole‑slide image preprocessing method that uses a foundation‑model‑based tissue detector operating at thumbnail resolution. By updating only 0.076% of the SAM2 model weights and leveraging a curated dataset of 30,000 thumbnail‑mask pairs, it generates accurate tissue masks and directly produces patch coordinates at the desired magnification, eliminating repeated patch‑level inference. The approach achieves 0.986 precision, is up to 16× faster than existing deep‑learning methods, and maintains downstream multiple‑instance learning performance across six slide‑level classification tasks.

By Ahmed Alagha, Christopher Leclerc, Yousef Kotp, Omar Metwally, Calvin Moras, Peter Rentopoulos, Ghodsiyeh Rostami, Bich Ngoc Nguyen, Jumanah Baig, Abdelhakim Khellaf, Vincent Quoc-Huy Trinh, Rabeb Mizouni, Hadi Otrok, Jamal Bentahar, Mahdi S. Hosseini