arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.
By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv:2606. 01023v1 Announce Type: cross Abstract: Visual inspection remains the dominant quality-control practice in woven and tufted carpet production, yet it is slow, subjective, and inconsistent at the line speeds and widths of modern looms.
By Akbar Erkinov
arXiv:2608. 13937v1 Announce Type: cross Abstract: Smart manufacturing processes are often installed with a large number of sensors, imaging devices and computers, which not only enable instant communication across various modules of a production system but also aid in intelligent manufacturing management.
By Yicheng Kang, Yuling Jiao, Xin Geng, Mahesh Nagarajan
arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.
By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv:2607. 12104v1 Announce Type: cross Abstract: Machine learning models for system diagnostics rely on kernel execution traces to capture fine-grained system behavior, but collecting production traces in industrial systems is costly due to runtime overhead, storage demands, and privacy constraints.
By Yuvraj Sehgal, Sneh Patel, Mahsa Panahandeh, Naser Ezzati-Jivan, Francois Tetreault
arXiv:2603. 12712v2 Announce Type: replace-cross Abstract: Large language models~(LLMs) have demonstrated remarkable capabilities in code generation, yet their performance remains limited on domain-specific tasks such as Computer-Aided Design~(CAD) code generation, largely due to the scarcity of high-quality training data.
By Yali Du, San-Zhuo Xi, Hui Sun, Ming Li