arXiv Machine Learning By Andreas Margraf, Henning Cui, J\"org H\"ahner

Have I Solved This Before? Retrieving Similar Segmentation Problems for Evolutionary Learning

Read the original on arXiv Machine Learning →

arXiv:2606. 08155v1 Announce Type: new Abstract: Reliable integration and solid configuration of monitoring systems constitute a fundamental prerequisites for achieving high efficiency and productivity in contemporary manufacturing environments.

Machine-generated by The Flow from the publisher's headline and feed description — not written or checked by a human. The full article lives at arXiv Machine Learning.

arXiv Computer Vision
Sep 7

LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection

The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.

By Pengfei Yang
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha