arXiv:2607. 10388v1 Announce Type: cross Abstract: Artificial intelligence (AI) is transforming electron microscopy by enabling quantitative analysis of increasingly large and complex datasets for nanoparticle characterization.
By Evropi Toulkeridou, Jiafei Li, Leonardo Lari, Panagiotis Grammatikopoulos
arXiv:2606. 10547v1 Announce Type: cross Abstract: Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage.
By Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi
arXiv:2606. 28220v1 Announce Type: new Abstract: Physics-informed neural networks (PINNs) have emerged as a powerful tool for solving nonlinear partial differential equations (PDEs), including battery electrochemical models.
By Gift Modekwe, Qiugang Lu
arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.
By Yusuke Ohtsubo, Kota Dohi, Koichiro Yawata, Koki Takeshita, Tatsuya Sasaki
arXiv:2510. 19465v2 Announce Type: replace-cross Abstract: Obtaining truly representative pore-scale images that match bulk formation properties remains a fundamental challenge in subsurface characterization, as natural spatial heterogeneity causes extracted sub-images to deviate significantly from core-measured values.
By Ali Sadeghkhani, Brandon Bennett, Masoud Babaei, Arash Rabbani
arXiv:2606. 00938v1 Announce Type: cross Abstract: Data-driven surrogate models are an alternative to numerical homogenization of heterogeneous materials.
By Matthias Br\"andel, Oliver Rheinbach