arXiv AI

Rethinking Infrastructure Inspection as Image Difference Classification: A Traffic Sign Case Study

arXiv:2606. 06375v1 Announce Type: new Abstract: Digital twins (DTs) allow the digitalization of road infrastructure inspection, though this is hindered by limited annotated data.

arXiv Machine Learning
Aug 27

Lowering the Barrier to AI-Driven Inspection: A No-Code Workflow for Automated Structural Defect Detection

The paper introduces YOLOEZ, a no-code, GUI-based tool that streamlines the entire YOLO model workflow—data labeling, training, and inference—for automated structural defect detection. It demonstrates that YOLOEZ outperforms traditional image‑processing methods across most detection metrics while simplifying deployment for users without programming expertise. The tool aims to lower technical barriers in structural health monitoring, enabling broader adoption of AI-driven inspection for predictive maintenance and intelligent structural systems.

By Michael Holm, Tanner McElroy, Xinghang Zhang, Guang Lin
arXiv Machine Learning
Aug 11

From Benchmark Performance to Tool Deployment: Human-in-the-Loop Anomaly Detection

arXiv:2608. 07770v1 Announce Type: new Abstract: Automated anomaly detection methods often report strong performance on curated academic benchmarks, but their behavior under real-world industrial conditions is less clear.

By Mike Szklarzewski, CJ George, Gavin Smithson, Christopher Stokes, Dakota Fulp, William M. Jones, Benjamin Wynn, Alexander Ur, Agit Yesiloz, Clint Kallenbach, Mark Swartz, Nathan DeBardeleben, Sharmistha Chakrabarti
arXiv Computer Vision
Sep 7

Training-Free Logical and Structural Anomaly Detection via Calibrated Fusion

The paper introduces a training‑free anomaly detector that simultaneously handles structural and logical defects by calibrating heterogeneous anomaly cues with statistics from normal images. This calibration aligns frozen representations, allowing their fusion without extra training or part‑level supervision. The resulting method achieves state‑of‑the‑art AUROC scores on MVTec‑LOCO and remains competitive on MVTec‑AD.

By Changyi Li, Miao Yu, Kai Dong, Yu Xiao
arXiv Computer Vision
Sep 21

Traffic Sign Recognition for Autonomous Driving Using Branched YOLOv2 and Geometric Features

The paper presents a traffic sign recognition system that extends YOLOv2 with a branched architecture and geometric feature integration. By adding intermediate prediction layers, the model can terminate inference early for easy cases, reducing computation time, while unsupervised Bayesian segmentation supplies geometric templates to improve classification of visually similar signs. Experiments on a combined GTSDB/GTSRB dataset show that the branched model achieves 0.680 mAP in 0.647 s, and adding geometric verification during inference raises mAP to 0.713.

By Arefeh Rezaei
arXiv Computer Vision
Sep 11

Vision Transformer-Based Multi-Level Feature Fusion for Multi-Label Sewer Defect Classification

The paper introduces Sewer-Transformer-ML, a hierarchical vision Transformer that fuses multi‑level features for multi‑label sewer defect classification, and two lightweight variants, Sewer-MobileNet-ML and Sewer-Mobile-TransNet, tailored for resource‑constrained inspection scenarios. On the Sewer‑ML test set, Sewer‑Transformer‑ML‑Base achieved an $F2_{ ext{CIW}}$ of 65.68% and an $F1_{ ext{Normal}}$ of 92.68%, topping the public leaderboard and surpassing the next best method by 7.6 percentage points in $F2_{ ext{CIW}}$. The lightweight Sewer‑MobileNet‑ML reached a comparable $F2_{ ext{CIW}}$ of 65.73% with only 17 M parameters, a 95% reduction from the base model, while Sewer‑Mobile‑TransNet achieved 96.43% accuracy under the standard data split, and ablation studies highlighted the effectiveness of direct concatenation for Transformer features and attention‑based fusion for multiscale CNN features.

By Xu Fang, Zhuoran Wang, Qing Li, Shengyu Zhang, Guanzhi Deng, Jianbiao He, Qingquan Li
arXiv Computer Vision
Aug 25

Quality Inspection of Printed Circuit Board Pin Insertion via Semantic Segmentation and Board-Level Feature Extraction

The paper introduces an automated defect detection system for printed circuit board (PCB) pin insertion, combining U‑Net semantic segmentation with contour‑based feature extraction and logistic regression for board‑level pass/fail classification. Segmentation masks generate contour representations of individual pins, from which features such as average contour size are extracted to train the classifier. Evaluated on an industrial dataset and a public PCB pin‑inspection dataset, the method achieved ROC‑AUC scores of 0.990 and 1.000, outperforming PatchCore and instance‑segmentation baselines.

By Nils Rabeneck, Andr\'e Kiunke, Nicole Hoess, Wolfgang Mauerer