arXiv:2510. 25573v2 Announce Type: replace-cross Abstract: Machine learning approaches for image classification have led to impressive advances in that field.
arXiv:2605. 30188v2 Announce Type: replace-cross Abstract: Reliable probability estimates are critical in many machine learning applications, yet modern classifiers are often poorly calibrated.
arXiv:2509. 04009v2 Announce Type: replace-cross Abstract: Due to their powerful feature association capabilities, neural network-based computer vision models have the ability to detect and exploit unintended patterns within the data, potentially leading to correct predictions based on incorrect or unintended but statistically relevant signals.
The paper investigates using Vision Language Models (VLMs) to accelerate verification and validation (V&V) of classification models by automatically detecting systematic errors. It introduces a VLM-based error slice detection (ESD) method that groups and labels errors, demonstrating its ability to identify perturbations in a non-military dataset and to cluster images by surroundings in a military context. The study highlights challenges such as underrepresentation of defence data in VLM training and limited contextual diversity, and suggests that while fully automated V&V is not yet feasible, VLMs could speed up the process in the future.
arXiv:2607. 05908v1 Announce Type: new Abstract: Real-world data distributions evolve over time, inducing temporal distribution shift that can substantially degrade the reliability of deployed machine learning systems.
arXiv:2605. 09697v3 Announce Type: replace-cross Abstract: In many real-world computer vision applications, including medical imaging and industrial inspection, binary classification tasks are characterized by a severe scarcity of positive samples.
arXiv:2606. 28416v1 Announce Type: cross Abstract: Deep neural networks (DNNs) have shown outstanding performance in visual recognition tasks within vision sensor networks; however, they are still vulnerable to adversarial manipulations and imperceptible perturbations that can lead to erroneous predictions.
arXiv:2609.28099v1 Announce Type: cross Abstract: Deep vision systems remain vulnerable to corruption, occlusion, and distribution shift despite strong benchmark performance. Existing reliability met...
arXiv:2606. 20216v1 Announce Type: cross Abstract: Machine learning algorithms deployed for evolving streaming environments must handle the non-stationary data distributions, commonly referred to as concept drift.
arXiv:2609.25788v1 Announce Type: new Abstract: Time Series Foundation Models (TSFMs) promise a paradigm shift toward zero-shot forecasting by eliminating task-specific training. However, existing wo...
arXiv:2608. 09768v1 Announce Type: new Abstract: A prediction that is both confident and wrong is a critical reliability failure because it can bypass abstention and human review precisely when the model is mistaken.
arXiv:2608. 07953v1 Announce Type: new Abstract: Distribution shift poses a significant challenge to the robustness of machine learning models, but the current solutions only aim to detect out-of-distribution (OOD) samples and predict uncertainty levels.
arXiv:2606. 07789v1 Announce Type: new Abstract: Data stream mining is fundamentally challenged by concept drift, where distributional changes can degrade model performance.