arXiv Machine Learning

Long-Term and Short-Term Transistor Aging in Deep Neural Networks: Impact and Mitigation

arXiv:2606. 04266v1 Announce Type: cross Abstract: Deep neural networks (DNNs) are used in a variety of real-world applications including, for example, image classification and speech recognition.

Hugging Face Trending Papers
Jul 6

SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits

As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.

arXiv Machine Learning
Sep 15

Beyond Noise: Understanding and Overcoming Temperature Effects in Analog DNN Inference

The paper investigates how temperature affects analog deep neural network (DNN) inference, focusing on both stochastic and systematic non‑idealities in analog hardware. Experiments show that temperature‑induced performance loss is mainly driven by systematic errors rather than random noise. The study evaluates various mitigation techniques, finding that noise‑aware training and temperature‑aware calibration—especially hardware‑in‑the‑loop training—best preserve inference accuracy across different thermal conditions.

By Niklas Summ, Xiao Wang, Hendrik Borras, Bernhard Klein, Holger Fr\"oning
arXiv Machine Learning
Jul 7

SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits

arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).

By Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi
arXiv Machine Learning
Sep 24

RAMP: Robust Adaptive Mixed-Precision Quantization for Edge CPU Vision Models

The paper introduces RAMP, a method for robust adaptive mixed‑precision quantization of vision models on edge CPUs. It evaluates 13 sensitivity metrics across four neural networks, finding that Jensen‑Shannon Divergence consistently identifies layers that can be safely quantized. Using K‑Means clustering on these metrics, RAMP achieves near‑lossless accuracy with an average 1.81× speed‑up, while cautioning against excluding low‑speed‑up layers that can fragment the computational graph.

By David Poblaci\'on-Criado, Dario Garcia-Gasulla, Eduardo Quinones
arXiv Machine Learning
Sep 17

FAME: An FPGA-Based Platform for Approximate Multipliers Evaluation with Pattern-Guided DNN Retraining

FAME is an FPGA-based platform that evaluates approximate multipliers directly in hardware, eliminating slow CPU/GPU LUT emulation and reducing evaluation time for DNN inference. It also introduces a pattern-guided retraining method that uses multiplier-specific patterns to recover accuracy losses. Experiments on ResNet‑18 and MobileNetV2 over ImageNet show up to 3.47× faster multiplier evaluation and a 65.5% accuracy improvement over prior retraining approaches.

By Rappy Saha, Nima Amirafshar, Jude Haris, Nima Taherinejad, Jos\'e Cano
arXiv AI
Jul 7

From Arithmetic to Logic: The Resilience of Logic and Lookup-Based Neural Networks Under Parameter Bit-Flips

arXiv:2603. 22770v2 Announce Type: replace-cross Abstract: The deployment of deep neural networks (DNNs) in safety-critical edge environments necessitates robustness against hardware-induced bit-flip errors.

By Alan T. L. Bacellar, Sathvik Chemudupati, Shashank Nag, Allison Seigler, Priscila M. V. Lima, Felipe M. G. Fran\c{c}a, Lizy K. John
arXiv Machine Learning
Sep 7

Adaptive Gated Deepfake Detection for Low-Resolution and Resource-Constrained Environments

The paper introduces AdaGate-DF, an adaptive gated deepfake detection framework designed for low-resolution and resource-constrained environments. By leveraging image-quality cues, the system routes samples through a dual multi-exit architecture, allowing high-quality images to exit earlier and reduce computational load. Evaluations on Celeb-DF and FaceForensics++ show that AdaGate-DF outperforms existing models such as MaD-CoRN and DefakeHop++ while maintaining low inference latency and robust performance across varying resolutions and class imbalance scenarios.

By Vaishnavi Sen, Cody Laurie, Rashida Hasan
arXiv AI
Sep 17

REQAP: Resilient Weight Packing and Quantization for Edge DNN Acceleration

The paper introduces REQAP, a reliability‑aware quantized weight packing technique for systolic‑array DNN accelerators. It uses a sensitivity‑driven mixed‑precision quantization to assign layer‑wise bit‑widths, a deterministic register‑level packing strategy for SIMD‑within‑a‑register execution, and selective bit‑level protection that replicates critical MSBs into unused register space. Experiments on AlexNet, VGG‑11, and ResNet‑18 show up to 62% memory reduction, 56% fewer MAC operations, and improved accuracy resilience under fault injection compared to baseline and fully protected models.

By Mahdi Taheri, Samira Nazari, Mubassher Ansari, Ali Azarpeyvand, Mohsen Afsharchi, Maksim Jenihhin, Christian Herglotz
arXiv Computer Vision
Sep 14

Joint Architecture-Token-Bitwidth Multi-Axis Optimization of Vision Transformers for Semiconductor IC Packaging

The paper introduces a holistic framework that jointly optimizes architecture, token, and bit-width for Vision Transformers (ViTs). It uses Neural Architecture Search (AutoFormer) to find compact backbones, token merging (ToMe) to reduce information processing, and fp16 mixed‑precision inference to accelerate operations. Experiments on ImageNet‑1K and a real‑world 3D X‑ray semiconductor defect dataset show over 10× improvements in throughput and reductions in parameters, FLOPs, and energy while preserving accuracy.

By Phat Nguyen, Xue Geng, Kaixin Xu, Wang Zhe, Xulei Yang, Ngai-Man Cheung