arXiv Machine Learning

Multitask Scanning Probe Microscopy

arXiv:2608. 09104v1 Announce Type: cross Abstract: Scanning probe microscopy provides nanoscale access to structural, electrical, electromechanical, magnetic, and mechanical properties of materials.

arXiv Computer Vision
Sep 23

Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning

The paper introduces a ptychography‑supervised learning framework that transforms 4D‑STEM data into real‑time atomic‑resolution phase images. By training a compact model on physics‑constrained reference phase maps from a single AuPd dataset, the method predicts local phase patches directly from diffraction patterns without probe calibration or iterative optimization. The resulting workflow achieves an online latency of ~0.27 ms per probe position, a 1,000‑fold speed‑up over GPU‑accelerated ePIE, and maintains atomic‑scale lattice contrast while generalizing across materials, defocus conditions, and instruments.

By H. Yue, C. -C. Chen, C. -N. Hsiao, J. Cheng, Y. Liu, X. Z. Liao, Steve F. Shu
arXiv Machine Learning
Sep 14

QuPAINT: Physics-Aware Multimodal Reasoning for Quantum Material Characterization

QuPAINT is a physics‑aware multimodal framework designed to characterize two‑dimensional quantum materials using optical microscopy. It employs the Synthetic Materials Framework (Synthia) to generate diverse synthetic images that preserve layer‑dependent optical behavior, and builds the QMat‑Instruct dataset with image‑specific reasoning traces. The framework integrates these signals through Physics‑Informed Attention (PIA) and is evaluated on the newly introduced QF‑Bench benchmark, achieving state‑of‑the‑art performance for flake detection and demonstrating improved spatial grounding and confidence calibration.

By Sankalp Pandey, Xuan-Bac Nguyen, Hoang-Quan Nguyen, Tim Faltermeier, Nicholas Borys, Hugh Churchill, Khoa Luu
arXiv AI
Jun 9

Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.

By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh
Hugging Face Trending Papers
Jun 28

STEMGym: Benchmarking Sequential Decision-Making under Dose Budgets in Autonomous Electron Microscopy

A central premise of autonomous scientific imaging is that smarter navigation, whether Bayesian, RL-based, or otherwise adaptive, is the principal lever for sample-efficient acquisition. We present evidence to the contrary in scanning transmission electron microscopy (STEM), an atomic-resolution imaging modality whose every measurement deposits damaging electron dose.

arXiv Machine Learning
Jun 10

Unsupervised Deep Learning for Limited-Angle STEM-EDX Tomography -- Application to 3D Chemical Analysis of Phase-Change Memory Devices

arXiv:2606. 10547v1 Announce Type: cross Abstract: Energy Dispersive X-ray (EDX) tomography in Scanning Transmission Electron Microscopy (STEM) enables 3D compositional and elemental mapping at the nanoscale, but its use is limited by restricted tilt ranges and low-dose conditions required to avoid beam damage.

By Daniel del Pozo Bueno, Serge Brosset, Theo Monniez, Gabriele Navarro, Philippe Ciuciu, Zineb Saghi
arXiv Computer Vision
2d ago

4DMulti: automated multicomponent identification at complex material interfaces

4DMulti is a physics‑guided learning framework that automates multicomponent identification from large‑scale four‑dimensional scanning transmission electron microscopy data. It leverages a 6‑million‑pattern diffraction database, a retrieval‑conditioned latent diffusion transformer (Sim2real) for realistic pattern generation, and a rotation‑invariant convolutional network for phase classification, achieving 98.82% accuracy on a five‑phase benchmark. The method introduces a diffraction‑inferred structural complexity metric and produces single‑nanometer‑resolution structural maps of complex material interfaces such as superconducting heterostructures, corroded alloys, and degraded solid‑state battery interfaces.

By Haoran Zhang, Zian Mao, Shufen Chu, Xiaoya He, Yuyan Guan, Antong Yang, Mingze Li, Xiaoqin Zeng, Yujun Xie