Hugging Face Trending Papers

STC-Net: Electroluminescence-Based Solar Cell Crack Segmentation for Power Loss Estimation

Accurate crack assessment in electroluminescence (EL) images is important for photovoltaic (PV) reliability analysis, yet existing segmentation methods often fail to capture the thin, elongated, and structurally constrained nature of crack defects. This paper proposes a Solar Topology Crack Network (STC-Net) that incorporates edge priors, spectral priors, and a boundary-topology refinement module to improve crack continuity and boundary preservation.

Hugging Face Trending Papers
Jul 23

SPDCN: Strip-based Deformable Convolutional Network for Steel Surface Defect Segmentation

Steel surface defect segmentation is critical for industrial quality inspection, yet existing methods struggle with elongated, anisotropic defects such as cracks and scratches due to the isotropic receptive fields of standard convolutions and rigid sampling grids that cannot adapt to irregular defect boundaries. To address these limitations, we propose Strip-based Predictor for Deformable Convolutional Networks (SPDCN) with two key innovations.

Hugging Face Trending Papers
Jun 4

Where, What, Why, and Importance: Structured Defect Grounding for Text-to-Image Feedback

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality.

arXiv AI
Jun 9

Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.

By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh
arXiv AI
Jun 19

Overcoming Labelled Data Scarcity for Defect Classification in Scanning Tunneling Microscopy

arXiv:2506. 01678v2 Announce Type: replace-cross Abstract: Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules.

By Nikola L. Kolev, Max Trouton, Filippo Federici Canova, Geoff Thornton, David Z. Gao, Neil J. Curson, Taylor J. Z. Stock