As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.
arXiv:2606. 17471v1 Announce Type: new Abstract: Traditional CPU, GPU, and NPU architectures are increasingly limited by the von Neumann bottleneck.
By Ching-Yi Lin, Shamik Kundu, Arnab Raha, Sahil Shah
The paper investigates how temperature affects analog deep neural network (DNN) inference, focusing on both stochastic and systematic non‑idealities in analog hardware. Experiments show that temperature‑induced performance loss is mainly driven by systematic errors rather than random noise. The study evaluates various mitigation techniques, finding that noise‑aware training and temperature‑aware calibration—especially hardware‑in‑the‑loop training—best preserve inference accuracy across different thermal conditions.
By Niklas Summ, Xiao Wang, Hendrik Borras, Bernhard Klein, Holger Fr\"oning
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
By Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi
The paper introduces RAMP, a method for robust adaptive mixed‑precision quantization of vision models on edge CPUs. It evaluates 13 sensitivity metrics across four neural networks, finding that Jensen‑Shannon Divergence consistently identifies layers that can be safely quantized. Using K‑Means clustering on these metrics, RAMP achieves near‑lossless accuracy with an average 1.81× speed‑up, while cautioning against excluding low‑speed‑up layers that can fragment the computational graph.
By David Poblaci\'on-Criado, Dario Garcia-Gasulla, Eduardo Quinones
FAME is an FPGA-based platform that evaluates approximate multipliers directly in hardware, eliminating slow CPU/GPU LUT emulation and reducing evaluation time for DNN inference. It also introduces a pattern-guided retraining method that uses multiplier-specific patterns to recover accuracy losses. Experiments on ResNet‑18 and MobileNetV2 over ImageNet show up to 3.47× faster multiplier evaluation and a 65.5% accuracy improvement over prior retraining approaches.
By Rappy Saha, Nima Amirafshar, Jude Haris, Nima Taherinejad, Jos\'e Cano