arXiv:2606. 04266v1 Announce Type: cross Abstract: Deep neural networks (DNNs) are used in a variety of real-world applications including, for example, image classification and speech recognition.
Summary generated by The Flow from the publisher's feed. The full article lives at arXiv Machine Learning.
As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV). Traditional reliability analysis methods, which rely on computationally intensive simulations or extensive lookup tables, fail to scale efficiently for large designs, creating a critical bottleneck in design space exploration.
arXiv:2606. 17471v1 Announce Type: new Abstract: Traditional CPU, GPU, and NPU architectures are increasingly limited by the von Neumann bottleneck.
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
arXiv:2603. 22770v2 Announce Type: replace-cross Abstract: The deployment of deep neural networks (DNNs) in safety-critical edge environments necessitates robustness against hardware-induced bit-flip errors.
arXiv:2608. 03589v1 Announce Type: new Abstract: We present a method for designing deep neural networks (DNNs) for intermittent, energy-autonomous, on-device learning on microcontroller units (MCUs).
arXiv:2603. 15106v2 Announce Type: replace Abstract: Enabling efficient deep neural network (DNN) inference on edge devices with different hardware constraints is a challenging task that typically requires DNN architectures to be specialized for each device separately.