arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.
By Yusuke Ohtsubo, Kota Dohi, Koichiro Yawata, Koki Takeshita, Tatsuya Sasaki
arXiv:2609.36639v1 Announce Type: new
Abstract: Scanning Tunneling Microscopy (STM) is a widely used tool for characterizing surfaces of materials at the atomic scale, playing a crucial role in disco...
By Huanhuan Zhao, Laxmi Bhurtel, Connor Vernachio, Fahmy Paiziah, Wonhee Ko, Arpan Biswas
arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.
By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh
SciFusion is a multimodal framework that uses a latent diffusion backbone to generate unified 3D scientific images. It introduces a compositional conditioning scheme that separates each modality into domain, object, and contrast representations, allowing knowledge transfer and zero‑shot synthesis of unseen compositions. The model also incorporates physics‑informed objectives specific to MRI, CT, and electron microscopy to ensure generated images respect modality‑dependent image formation processes, and demonstrates improved fidelity and cross‑domain generalization across 15 imaging modalities.
By Luoxi Wang, Alessio Quercia, Hanno Scharr, Arya Bangun
Existing 3D generative approaches are typically developed for individual imaging modalities, requiring substantial modality-specific data and limiting their ability to exploit shared structure across...
A central premise of autonomous scientific imaging is that smarter navigation, whether Bayesian, RL-based, or otherwise adaptive, is the principal lever for sample-efficient acquisition. We present evidence to the contrary in scanning transmission electron microscopy (STEM), an atomic-resolution imaging modality whose every measurement deposits damaging electron dose.