arXiv:2606. 26492v1 Announce Type: cross Abstract: Deep Learning (DL) programs can fail during training for many reasons, and diagnosing the cause is a costly and time-consuming maintenance task.
By Sigma Jahan
TreeFI is a value‑aware statistical fault‑injection technique for FP32 single‑bit faults in deep neural network activations and weights. It partitions each layer’s value distribution into intervals with similar expected bit‑flip behavior using regression trees, then allocates injections across these intervals based on their relevance for failure‑rate estimation. This stratified approach preserves target confidence and error margins while dramatically reducing the required injection budget—up to 72.1× for activations and 11.2× for weights compared to existing baselines.
By Noam Bires, Marcello Traiola, Angeliki Kritikakou, Elisa Fromont
arXiv:2606. 04310v1 Announce Type: new Abstract: Deep Neural Networks (DNNs) are increasingly being deployed in security-critical and safety-sensitive applications, which makes rigorous testing essential to identify and mitigate model weaknesses.
By Bin Duan, Matthew B. Dwyer, Guowei Yang
arXiv:2412. 18980v2 Announce Type: replace Abstract: Uncertainty-aware deep learning (DL) models recently gained attention in fault diagnosis as a way to promote the reliable detection of faults when out-of-distribution (OOD) data arise from unseen faults (epistemic uncertainty) or the presence of noise (aleatoric uncertainty).
By Reza Jalayer, Masoud Jalayer, Andrea Mor, Carlotta Orsenigo, Carlo Vercellis
arXiv:2512. 10485v2 Announce Type: replace-cross Abstract: Vulnerability detection methods based on deep learning (DL) have shown strong performance on benchmark datasets, yet their real-world effectiveness remains underexplored.
By Chaomeng Lu, Bert Lagaisse
arXiv:2608. 04173v1 Announce Type: new Abstract: Deep neural networks (DNNs) deployed on resource-constrained neuromorphic hardware face three concurrent challenges: the need for model compression through pruning, vulnerability to adversarial input perturbations, and susceptibility to hardware-induced weight faults such as stuck-at-zero errors.
By Manali Dangarikar, Cory Merkel