arXiv Machine Learning By Bin Duan, Matthew B. Dwyer, Guowei Yang

Latent Anchor-Driven Test Generation for Deep Neural Networks

Read the original on arXiv Machine Learning →

arXiv:2606. 04310v1 Announce Type: new Abstract: Deep Neural Networks (DNNs) are increasingly being deployed in security-critical and safety-sensitive applications, which makes rigorous testing essential to identify and mitigate model weaknesses.

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