The study examines how reducing the width of deep neural networks through structured pruning affects their robustness to Single Event Upsets (SEUs). By iteratively pruning baseline models and conducting fault-injection tests at each stage, the authors find that while pruning increases per-inference sensitivity to bit-flips, the shorter execution time offsets this, lowering the overall SEU probability. Consequently, structured pruning can deliver energy and latency savings without compromising reliability for space-based AI systems.
By Toon Vinck, Na\"in Jonckers, Jaro De Roose, Jeffrey Prinzie, Peter Karsmakers
arXiv:2607. 12868v1 Announce Type: cross Abstract: Deep learning systems often fail due to subtle implementation faults that alter training behavior.
By Sigma Jahan
arXiv:2603. 22770v2 Announce Type: replace-cross Abstract: The deployment of deep neural networks (DNNs) in safety-critical edge environments necessitates robustness against hardware-induced bit-flip errors.
By Alan T. L. Bacellar, Sathvik Chemudupati, Shashank Nag, Allison Seigler, Priscila M. V. Lima, Felipe M. G. Fran\c{c}a, Lizy K. John
arXiv:2606. 26492v1 Announce Type: cross Abstract: Deep Learning (DL) programs can fail during training for many reasons, and diagnosing the cause is a costly and time-consuming maintenance task.
By Sigma Jahan
arXiv:2610.07029v1 Announce Type: cross
Abstract: Resistive random-access memory (ReRAM)-based Processing-in-Memory (PIM) accelerator is a promising platform for processing massively memory intensive...
By Aniseh Dorostkar, Hamed Farbeh, Hamid R. Zarandi
arXiv:2607. 11193v1 Announce Type: cross Abstract: To ensure the overall quality of AI-enabled software, not only traditional software components but also AI components need to be tested and repaired.
By Yuta Ishimoto, Paolo Arcaini, Fuyuki Ishikawa, Masanari Kondo, Naoyasu Ubayashi, Yasutaka Kamei