arXiv:2610.15092v1 Announce Type: cross
Abstract: Quantization plays a crucial role in efficiently deploying deep learning models on resource-constrained devices. Post-training quantization does not...
By Reem Abdel-Salam, Ahmed H. Abdel-Gawad, Amr G. Wassal
The paper presents a PyTorch-based framework for designing and optimizing binarized neural networks, incorporating freezing and pruning mechanisms. It introduces a novel pruning method that uses a global weighting scheme to assess parameter importance across abstraction levels, achieving a 70% pruning rate on VGG11 without sacrificing accuracy—outperforming existing binarized pruning results of 41%. The framework facilitates rapid, reproducible evaluation and prototyping of state‑of‑the‑art binarized network techniques.
By Roan Rubiales, Jean Pierre David
The paper introduces W16A16, a 16‑bit precision quantization method for convolutional neural networks aimed at microcontroller units. On the Armv7E‑M architecture, W16A16 delivers faster inference speeds and lower energy consumption than existing quantization schemes while reducing quantization errors by roughly tenfold compared to 8‑bit approaches. The authors analyze the MCU architecture, explain why 16‑bit operations yield performance gains, and evaluate empirical errors and resource usage across regression and classification tasks.
By Rui Liu, Benjamin Paa{\ss}en
Deep neural networks have witnessed remarkable advancements in recent years and have become integral to various applications. However, alongside these developments, training and deployment of neural network models on embedding and edge devices face significant challenges due to limited memory and computational resources.
arXiv:2606. 04063v1 Announce Type: cross Abstract: Deploying large language models (LLMs) is challenging due to their significant memory and computational requirements.
By Hoang-Loc La, Truong-Thanh Le, Amir Taherkordi, Phuong Hoai Ha
arXiv:2607. 06600v1 Announce Type: cross Abstract: Line segment detection is a key building block in visual SLAM, 3D reconstruction, and industrial inspection.
By Parsa Hassani Shariat Panahi, Amir Hossein Jalilvand, M. Hassan Najafi