arXiv AI

Information-Theoretic Causal Modelling of Semiconductor Process Dynamics

arXiv:2608. 14678v1 Announce Type: cross Abstract: With the progress of the semiconductor industry toward increasingly complex compute devices and tighter process tolerances, advanced process control has become crucial.

arXiv AI
Jul 29

Dynamic Multi-Criteria Bottleneck Severity Index (DMBSI) for Semiconductor Wafer Manufacturing: A Genetically Optimised Framework for Reentrant Production Systems

arXiv:2607. 24819v1 Announce Type: cross Abstract: Wafer fabrication exhibits unique characteristics, including reentrant process flows, variable bottlenecks, and highly variable process conditions.

By Mohammad Sharifur Rahman, Karl McCreadie, Saugat Bhattacharyya, M M Manjurul Islam, Cormac McAteer, Bryan John Baker, Nuala Parker, Girijesh Prasad
Hugging Face Trending Papers
Jul 9

CAAD: Causality-Aware Multivariate Time Series Anomaly Detection via Multi-Scale Alignment and Structural Causal Consistency

The operational integrity of complex industrial systems relies on precise anomaly detection and diagnosis. The vast majority of existing methods narrowly focus on capturing temporal similarities of representations, often overlooking the disruption of internal causal relationships, which characterizes system failures and latent anomalies.

arXiv Machine Learning
Jul 21

Causal Discovery on Irregular Time Series

arXiv:2607. 18226v1 Announce Type: new Abstract: Causal discovery methods have shown strong performance in temporal systems, but they typically rely on regular and discrete lag structures, limiting their applicability to regularly sampled data.

By Martim Penim, Ricardo Ribeiro Pereira, Jacopo Bono, Hugo Ferreira, M\'ario A. T. Figueiredo, Pedro Bizarro
arXiv Machine Learning
6d ago

Forward and Inverse Virtual Metrology for Phototransistor Gain: A Hierarchical, Uncertainty-Aware Approach for Small Production Datasets

arXiv:2608. 11868v1 Announce Type: new Abstract: The customization, optimization and stabilization of the process flow of a silicon bipolar phototransistor commits months of cleanroom time before a finished device can be measured, so a model that predicts device gain from process parameters before a run has value out of proportion to its accuracy.

By Mahshid Amirabgir, Lorenza Ferrario, Paolo Conci, Mahdieh Amirabgir, Giancarlo Orengo
arXiv Machine Learning
Jun 16

Graphical conditional generative modeling for digital twin modeling

arXiv:2606. 16219v1 Announce Type: cross Abstract: Digital twin modeling, including control and data assimilation under model uncertainty, often faces an open-ended fidelity problem: adding variables, data streams, and time scales can indefinitely increase model complexity, ultimately producing systems that are difficult to maintain, validate, interpret, and use for stress or safety testing.

By Zongren Zou, Th\'eo Bourdais, Ricardo Baptista, Houman Owhadi