arXiv:2608. 14678v1 Announce Type: cross Abstract: With the progress of the semiconductor industry toward increasingly complex compute devices and tighter process tolerances, advanced process control has become crucial.
By Daniel S{\o}rensen, Giorgio Melchiorre, Sudip Bandyopadhyay, Sandip Halder, Roel Wuyts, Bappaditya Dey
arXiv:2605. 09370v3 Announce Type: replace-cross Abstract: Large-scale AI training is now fundamentally a distributed systems problem, and hardware failures have become routine operating conditions rather than rare exceptions.
By Daemyung Kang, Eunjin Hwang, Hanjeong Lee, HyeokJin Kim, Hyunhoi Koo, Jeongkyu Shin, Jeongseok Kang, Jihyun Kang, Joongi Kim, Junbum Lee, Jungseung Yang, Kyujin Cho, Youngsook Song
arXiv:2608. 13790v1 Announce Type: cross Abstract: Macro placement significantly affects a chip's post-route performance, power, and area (PPA).
By Ruogu Chen, Jie Han
arXiv:2608. 11154v1 Announce Type: new Abstract: Detecting or attributing a supply-chain disruption is not the same as selecting the intervention that maximizes recoverable net value.
By Shiqi Huang, Jiani He, Dingyan Shang, Yihua Xu, Jize Li, Yan Lyu, Lashimi Muraleedharan Nair
arXiv:2606. 11387v1 Announce Type: cross Abstract: Short pretraining runs can reduce experimental cost, but they can also over-promote configurations that only look strong at tiny budgets.
By Felipe Chavarro Polania
arXiv:2606. 10457v1 Announce Type: new Abstract: Decision rules that enterprise experts apply tacitly -- in auditing, compliance, and contract review -- can be systematically recovered and improved through iterative error analysis.
By Junli Zha, Jinbo Wang, Chao Zhou, Xiang Song