arXiv:2503. 05169v2 Announce Type: replace Abstract: Applying machine learning to increasingly high-dimensional problems with sparse or biased training data increases the risk that a model is used on inputs outside its training domain.
arXiv:2607. 12094v1 Announce Type: cross Abstract: Reliable detection of out-of-distribution (OOD) samples is crucial for the safe deployment of machine learning models.
arXiv:2505. 15284v2 Announce Type: replace Abstract: Out-of-Distribution (OoD) detection is vital for the reliability of deep neural networks, the key of which lies in effectively characterizing the disparities between OoD and In-Distribution (InD) data.
arXiv:2409. 10094v3 Announce Type: replace-cross Abstract: Out-of-Distribution (OoD) detection aims to justify whether a given sample is from the training distribution of the classifier-under-protection, i.
arXiv:2605. 28021v2 Announce Type: replace Abstract: Out-of-distribution (OOD) detection is essential for deploying machine learning models in open-world and safety-critical scenarios, where test inputs may deviate from the training distribution and overconfident predictions on unknown samples can lead to unreliable decisions.
arXiv:2605. 07821v2 Announce Type: replace-cross Abstract: Out-of-distribution (OOD) detection is crucial for ensuring the reliability of deep learning models.
Detecting out-of-distribution (OOD) data is crucial for reliable machine learning deployment. Among detection strategies, post-hoc methods are particularly attractive due to their efficiency, as they operate directly on pre-trained networks without requiring retraining.
arXiv:2606. 29952v1 Announce Type: cross Abstract: Detecting out-of-distribution (OOD) data is crucial for reliable machine learning deployment.
arXiv:2510. 06505v2 Announce Type: replace-cross Abstract: Out-of-distribution (OOD) detection plays a crucial role in ensuring the robustness of machine learning systems deployed in real-world applications.
arXiv:2608. 15802v1 Announce Type: cross Abstract: Out-of-distribution (OOD) detection remains challenging for image classifiers, especially when near-OOD samples lie close to in-distribution (ID) class boundaries.
arXiv:2606. 26973v1 Announce Type: cross Abstract: Open-set semi-supervised learning aims to leverage unlabeled data that may contain out-of-distribution outliers while maintaining performance on in-distribution classes.
arXiv:2605. 09697v3 Announce Type: replace-cross Abstract: In many real-world computer vision applications, including medical imaging and industrial inspection, binary classification tasks are characterized by a severe scarcity of positive samples.
arXiv:2506. 14194v2 Announce Type: replace Abstract: We present a theory for the construction of out-of-distribution (OOD) detection features for neural networks.