arXiv:2606. 29952v1 Announce Type: cross Abstract: Detecting out-of-distribution (OOD) data is crucial for reliable machine learning deployment.
By Seonghwan Park, Hyunji Jung, Dongyeop Lee, Namhoon Lee
arXiv:2607. 12094v1 Announce Type: cross Abstract: Reliable detection of out-of-distribution (OOD) samples is crucial for the safe deployment of machine learning models.
By Ayush Karmacharya (Purdue University), Luke Luschwitz (Purdue University), Lucia Romero (Purdue University), Yanan Niu (EPFL), Joseph Campbell (Purdue University)
arXiv:2503. 05169v2 Announce Type: replace Abstract: Applying machine learning to increasingly high-dimensional problems with sparse or biased training data increases the risk that a model is used on inputs outside its training domain.
By Felix Krumbiegel, Juniper Tyree, Michael Boy, Petri Clusius, Andreas Rupp
arXiv:2510. 06505v2 Announce Type: replace-cross Abstract: Out-of-distribution (OOD) detection plays a crucial role in ensuring the robustness of machine learning systems deployed in real-world applications.
By Momin Abbas, Ali Falahati, Hossein Goli, Mohammad Mohammadi Amiri
arXiv:2605. 28021v2 Announce Type: replace Abstract: Out-of-distribution (OOD) detection is essential for deploying machine learning models in open-world and safety-critical scenarios, where test inputs may deviate from the training distribution and overconfident predictions on unknown samples can lead to unreliable decisions.
By Fengqiang Wan, Qing-Yuan Jiang, Fu Shen, Yang Yang
arXiv:2605. 30188v2 Announce Type: replace-cross Abstract: Reliable probability estimates are critical in many machine learning applications, yet modern classifiers are often poorly calibrated.
By Eug\`ene Berta, David Holzm\"uller, Francis Bach, Michael I. Jordan