arXiv AI By Boyang Dai, Chaoqi Chen, Yizhou Yu

Mitigating Simplicity Bias in OOD Detection through Object Co-occurrence Analysis

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arXiv:2605. 07821v2 Announce Type: replace-cross Abstract: Out-of-distribution (OOD) detection is crucial for ensuring the reliability of deep learning models.

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arXiv Machine Learning
Aug 20

SPK: Eliciting Structured Prior Knowledge for Interpretable Out-of-Distribution Detection in Real-Time Object Detection

The paper introduces Structured Prior Knowledge (SPK), a framework that extracts and organizes latent priors from pretrained object detectors to improve out-of-distribution (OoD) detection. SPK uses in-distribution data and hallucination-inducing samples to elicit part-level semantic concepts, then combines these with geometric and contextual priors into a compact five-dimensional representation. Experiments across various detector architectures and OoD benchmarks show that SPK achieves state-of-the-art performance, demonstrating that pretrained detectors encode richer latent knowledge than previously exploited.

By Changshun Wu, Weicheng He, Xiaowei Huang, Saddek Bensalem
arXiv AI
Sep 1

Background-Free Objectness Learning for Class-Agnostic Detection

Background-Free Objectness Learning (B-FOR) is a dense, class‑agnostic detection framework that learns objectness without treating unlabeled regions as background. It predicts multi‑scale object‑center and scale fields, using spatially structured soft targets to supervise only reliable annotated areas and introduces displacement‑aware scale fields to model object extent. Experiments on PASCAL VOC, MS‑COCO, and Open Images show B‑FOR improves recall by over +10 AR points compared to prior class‑agnostic baselines, with ablation studies confirming the importance of localized supervision and displacement‑aware scaling.

By Dania Batool, Liliana Lo Presti, Marco La Cascia, Filippo Vella
arXiv AI
Aug 12

Token-Based Detection of Spurious Correlations in Vision Transformers

arXiv:2509. 04009v2 Announce Type: replace-cross Abstract: Due to their powerful feature association capabilities, neural network-based computer vision models have the ability to detect and exploit unintended patterns within the data, potentially leading to correct predictions based on incorrect or unintended but statistically relevant signals.

By Solha Kang, Esla Timothy Anzaku, Wesley De Neve, Arnout Van Messem, Joris Vankerschaver, Francois Rameau, Utku Ozbulak