arXiv Machine Learning September 11, 2026 By Hyunjun Choi, JaeHo Chung, Hawook Jeong

Optimizing Three Critical Factors for Practical and Effective OOD Detection Fine-Tuning

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The paper introduces a framework for out-of-distribution (OOD) detection that addresses the trade‑off between detection performance and classification accuracy caused by fine‑tuning with auxiliary outlier data. It optimizes three factors—model reminder, data sampling, and representation learning—by proposing Self‑Knowledge Distillation to preserve accuracy, Semi‑hard Outlier Sampling to enhance detection with minimal data, and Outlier‑aware Supervised Contrastive Learning to improve ID‑OOD separability. The combined approach yields cumulative gains, outperforming existing methods on diverse benchmarks, especially in long‑tailed scenarios, and offers a robust baseline for real‑world OOD detection.

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