arXiv Machine Learning By Hyunjun Choi, JaeHo Chung, Hawook Jeong

Optimizing Three Critical Factors for Practical and Effective OOD Detection Fine-Tuning

Read the original on arXiv Machine Learning →

The paper introduces a framework for out-of-distribution (OOD) detection that addresses the trade‑off between detection performance and classification accuracy caused by fine‑tuning with auxiliary outlier data. It optimizes three factors—model reminder, data sampling, and representation learning—by proposing Self‑Knowledge Distillation to preserve accuracy, Semi‑hard Outlier Sampling to enhance detection with minimal data, and Outlier‑aware Supervised Contrastive Learning to improve ID‑OOD separability. The combined approach yields cumulative gains, outperforming existing methods on diverse benchmarks, especially in long‑tailed scenarios, and offers a robust baseline for real‑world OOD detection.

Machine-generated by The Flow from the publisher's headline and feed description — not written or checked by a human. The full article lives at arXiv Machine Learning.

arXiv Machine Learning
Jul 21

AOE: Exhaustive Out-of-Distribution Detection via Recalibrating Outlier Labels

arXiv:2605. 28021v2 Announce Type: replace Abstract: Out-of-distribution (OOD) detection is essential for deploying machine learning models in open-world and safety-critical scenarios, where test inputs may deviate from the training distribution and overconfident predictions on unknown samples can lead to unreliable decisions.

By Fengqiang Wan, Qing-Yuan Jiang, Fu Shen, Yang Yang