This survey reviews industrial anomaly synthesis (IAS), a field that has been underrepresented in prior studies focused on anomaly detection. It categorizes IAS methods into four paradigms—hand‑crafted, distribution‑hypothesis, generative model, and vision‑language model—while presenting a taxonomy that facilitates systematic comparison. The paper also discusses datasets, benchmarks, evaluation metrics, multimodal advances, and practical deployment considerations, offering guidance for future research.
By Yanshu Wang, Xichen Xu, Jinbao Wang, Chengbin Ma, Xiaoning Lei, Guoyang Xie, Guannan Jiang, Zhichao Lu
arXiv:2610.19610v1 Announce Type: new
Abstract: Industrial anomaly detection (AD) is bottlenecked by the scarcity of anomalous samples, making high-fidelity anomaly synthesis crucial for improving do...
By Haoxiang Rao, Fang Zhao, Zhao Wang, Weijia Li, Chenyang Si, Caifeng Shan
arXiv:2602. 13807v2 Announce Type: replace Abstract: Time series anomaly detection is critical in many real-world applications, where effective solutions must localize anomalous regions and support reliable decision-making under complex settings.
By Xiaoyu Tao, Yuchong Wu, Mingyue Cheng, Ze Guo, Tian Gao
arXiv:2609.37314v1 Announce Type: new
Abstract: Synthetic anomaly generation helps expand industrial anomaly datasets when real defects are scarce or unavailable. Existing approaches lie at two extre...
By Abhay Kumar Das, Rajesh Gangireddy, Ashwin Vaidya, Samet Akcay
The paper introduces DPA, a diffusion-based framework that decouples product-agnostic anomaly representations to enable zero-shot anomaly generation. By reusing real anomalies from existing source products and filtering them for plausibility, DPA learns product-irrelevant anomaly embeddings that can be transferred across products. An adaptive mask-guided pipeline and a training-free labeling module further refine the realism and localization of generated anomalies, leading to improved performance on MVTec-AD, VisA, and a new anomaly-transfer benchmark.
By Hang Yao, Yansheng Fu, Ming Liu, Zifei Yan, Yanli Ji, Hongzhi Zhang, Wangmeng Zuo
arXiv:2607. 18142v1 Announce Type: cross Abstract: Industrial Video Anomaly Detection (IVAD) aims to identify anomalous objects and events in an industrial process, which is crucial for modern manufacturing and quality control systems.
By Mei Yuan, Qi Long, Qifeng Wu, Zhenyang Li, Yizhou Zhao, Lei Wang, Yang Liu, Min Xu
MAADBench is a refreshable benchmark for anomaly detection in multi‑agent systems powered by large language models. It addresses the challenge of keeping benchmarks current by sampling and coupling generative tasks, generating trace data under configurable LLM backbones, and automatically providing deterministic step‑level labels. The authors evaluated 25 anomaly‑detection methods on 5,200 labeled traces, finding that existing approaches depend heavily on supervision, struggle with subtle MAS‑specific anomalies, and lack robustness across different LLM backbones.
By Lei Ma, Dennis Hofmann, Haowen Xu, Joshua DeOliveira, Peter VanNostrand, Lei Cao, Elke Rundensteiner
arXiv:2608. 08219v1 Announce Type: cross Abstract: Video anomaly detection (VAD) is a critical yet challenging task due to the complex and diverse nature of real-world scenarios.
By Rui Wang, Yeteng Wu, Xianling Zhang, Mengshi Qi
arXiv:2610.15032v1 Announce Type: cross
Abstract: Industrial anomaly detection benchmarks have advanced rapidly, yet they remain largely static and therefore underrepresent deployment settings in whi...
By {\L}ukasz Marcjan, Dorota Wilk-Ko{\l}odziejczyk, Roberto Corizzo
arXiv:2608.29783v1 Announce Type: new
Abstract: Industrial anomaly detection is a critical component of modern manufacturing. Most traditional unsupervised methods rely on modelling normal feature di...
By Weifei Chen, Honghao Zhang, Zhiyuan You, Xinyi Le
arXiv:2608. 11260v1 Announce Type: new Abstract: Video Anomaly Detection (VAD) aims to identify anomalous events and localize their temporal intervals.
By Shibo Gao, Peipei Yang, Xu-Yao Zhang, Linlin Huang
arXiv:2610.07016v1 Announce Type: cross
Abstract: In few-shot industrial anomaly detection, the few normal target images provide no direct defect supervision, making anomaly prompts difficult to lear...
By Mengyang Zhao, Teng Fu, Haiyang Yu, Ke Niu, Bin Li, Xiangyang Xue