arXiv Machine Learning

Have I Solved This Before? Retrieving Similar Segmentation Problems for Evolutionary Learning

arXiv:2606. 08155v1 Announce Type: new Abstract: Reliable integration and solid configuration of monitoring systems constitute a fundamental prerequisites for achieving high efficiency and productivity in contemporary manufacturing environments.

arXiv Computer Vision
Sep 7

LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection

The paper introduces LUMIN, a lightweight network for manufacturing anomaly detection, and PSP, a four‑stage adaptive memory bank sampling pipeline that eliminates backbone forward passes. PSP achieves near‑random construction speed, 341× faster than FPS, while parallel similarity computation and stratified pixel sampling cut inference time by 20× with minimal accuracy loss. Experiments on five benchmarks show that LUMIN and PSP reach state‑of‑the‑art sampling accuracy with dramatically reduced latency and memory usage.

By Pengfei Yang
arXiv Computer Vision
Nov 2

Beyond CLIP: Calibrated (Few-Shot) Defect Detection With System One Decision Models

The paper introduces a framework for k-shot learning with structured decision models Jev and Clef-Flash, enabling defect detection using as few as two reference images per class. It presents an agentic method to refine text prompts that guide classification and a calibration technique to improve defect probability reliability. Experiments on five manufacturing case studies show that both models outperform CLIP with the same limited references, and the proposed refinements and calibration consistently enhance accuracy and reduce Brier scores across most configurations.

By Fadel M. Megahed, Ying-Ju Chen
arXiv AI
Jul 23

SynSur: An end-to-end generative pipeline for synthetic industrial surface defect generation and detection

arXiv:2604. 26633v2 Announce Type: replace-cross Abstract: Industrial surface defect inspection suffers from a fundamental data bottleneck: defects are rare, annotations require expert knowledge, and collecting balanced training sets is slow and costly.

By Paul Julius K\"uhn, Mika Pommeranz, Arjan Kuijper, Saptarshi Neil Sinha
arXiv Computer Vision
Oct 9

A Survey on Industrial Anomaly Synthesis

This survey reviews industrial anomaly synthesis (IAS), a field that has been underrepresented in prior studies focused on anomaly detection. It categorizes IAS methods into four paradigms—hand‑crafted, distribution‑hypothesis, generative model, and vision‑language model—while presenting a taxonomy that facilitates systematic comparison. The paper also discusses datasets, benchmarks, evaluation metrics, multimodal advances, and practical deployment considerations, offering guidance for future research.

By Yanshu Wang, Xichen Xu, Jinbao Wang, Chengbin Ma, Xiaoning Lei, Guoyang Xie, Guannan Jiang, Zhichao Lu
arXiv Machine Learning
Oct 22

Region-Aware Multi-View Inspection Using Deep Learning and Domain-Informed Decision Fusion

The paper introduces a region‑aware dual‑model inspection framework that uses instance segmentation for seat‑region defects and image‑level classification for shaft‑region anomalies, followed by a deterministic decision fusion layer that applies industrial SOPs to produce a final component‑level decision. In experiments on 380 automotive fuel injector needles, the fusion layer maintained 100% recall of non‑conforming parts while reducing the false‑rejection rate from 57.6% to 10.9%, an 81.1% drop in false positives. The study shows that formalizing acceptance criteria can translate sensitive visual detections into practical, traceable decisions for precision component inspection.

By Srivishnu Ethirajulu Krishnaraj, Rishikesh R. Chopade
arXiv Machine Learning
Aug 17

Deep Vision in Smart Manufacturing: MODERN Framework for Intelligent Quality Monitoring and Diagnosis

arXiv:2608. 13937v1 Announce Type: cross Abstract: Smart manufacturing processes are often installed with a large number of sensors, imaging devices and computers, which not only enable instant communication across various modules of a production system but also aid in intelligent manufacturing management.

By Yicheng Kang, Yuling Jiao, Xin Geng, Mahesh Nagarajan