Hierarchical Fault Detection and Diagnosis for Transformer Architectures
arXiv:2604. 28118v2 Announce Type: replace-cross Abstract: Transformers now underpin critical AI systems across industry and research.
arXiv:2607. 11193v1 Announce Type: cross Abstract: To ensure the overall quality of AI-enabled software, not only traditional software components but also AI components need to be tested and repaired.
arXiv:2604. 28118v2 Announce Type: replace-cross Abstract: Transformers now underpin critical AI systems across industry and research.
arXiv:2607. 11228v1 Announce Type: cross Abstract: While Large Vision-Language Models (LVLMs) demonstrate remarkable capabilities, they remain highly susceptible to embedded social biases.
arXiv:2606. 26492v1 Announce Type: cross Abstract: Deep Learning (DL) programs can fail during training for many reasons, and diagnosing the cause is a costly and time-consuming maintenance task.
arXiv:2607. 13047v1 Announce Type: new Abstract: Parameter decomposition (PD) decomposes neural networks into interpretable computational components that faithfully reflect the original network's operations.
arXiv:2608. 04173v1 Announce Type: new Abstract: Deep neural networks (DNNs) deployed on resource-constrained neuromorphic hardware face three concurrent challenges: the need for model compression through pruning, vulnerability to adversarial input perturbations, and susceptibility to hardware-induced weight faults such as stuck-at-zero errors.
arXiv:2512. 10485v2 Announce Type: replace-cross Abstract: Vulnerability detection methods based on deep learning (DL) have shown strong performance on benchmark datasets, yet their real-world effectiveness remains underexplored.
While Large Vision-Language Models (LVLMs) demonstrate remarkable capabilities, they remain highly susceptible to embedded social biases. Existing bias evaluation protocols predominantly rely on static datasets, which provide only a superficial assessment, as their fixed test cases cannot adaptively evolve to measure the true depth and limits of model vulnerabilities.
arXiv:2607. 15753v1 Announce Type: new Abstract: Deep Neural Networks (DNNs) used in safety-critical applications are vulnerable to hardware and memory faults that corrupt network weights and degrade reliability.
arXiv:2607. 12868v1 Announce Type: cross Abstract: Deep learning systems often fail due to subtle implementation faults that alter training behavior.
arXiv:2603. 12222v2 Announce Type: replace-cross Abstract: Vision Transformers require significant computational resources and memory bandwidth, severely limiting their deployment on resource-constraint hardware.
arXiv:2608. 12144v1 Announce Type: cross Abstract: Over the past decade, many test adequacy metrics have been proposed for deep learning that characterize test dataset adequacy from different perspectives, e.
arXiv:2607. 17624v1 Announce Type: new Abstract: Transformers are remarkably versatile and their design is largely consistent across a variety of applications.