The paper introduces Anomaly‑LR, a defect‑grounded latent reasoning framework for industrial anomaly detection that builds a global understanding of an image and then refines anomaly‑relevant representations directly in visual latent space. It also presents IAD‑LR‑22K, a new instruction dataset with 22,228 image‑question pairs and detailed annotations. Experiments demonstrate that Anomaly‑LR outperforms comparable‑scale methods on multiple IAD benchmarks without needing external references or tools.
By Jaron Yeh, Yen-Wei Chang, Jiang Liu, Shao-Yuan Lo
arXiv:2606. 01992v1 Announce Type: cross Abstract: Industrial anomaly detection has historically been a unimodal task.
By Stefano Samele, Eugenio Lomurno, Teodora Jovanovic, Sanjay Shivakumar Manohar, Alberto Crivellaro, Matteo Matteucci
arXiv:2609.40325v1 Announce Type: new
Abstract: As interactive 3D worlds are increasingly used to study intelligent behavior, it becomes important to develop efficient pipelines for identifying anoma...
By Ziyan Jiang, Jingbo Yang, Jiabao Ji, Yujian Liu, Qiucheng Wu, Tommi Jaakkola, Yang Zhang, Shiyu Chang
arXiv:2606. 22437v2 Announce Type: replace-cross Abstract: We conduct a systematic study of 18 widely used vision-language benchmarks and identify three major issues: 1) many items do not rely on visual cues and therefore fail to effectively measure multimodal understanding; 2) many items are already close to performance saturation for current LVLMs, which limits their discriminative power; 3) a small number of anomalous items affect the reliability of evaluation results.
By Wenzhen Yuan, Jiacheng Ruan, Wutao Xiong, Chengping Zhao, Ting Liu, Yuzhuo Fu
arXiv:2608.29783v1 Announce Type: new
Abstract: Industrial anomaly detection is a critical component of modern manufacturing. Most traditional unsupervised methods rely on modelling normal feature di...
By Weifei Chen, Honghao Zhang, Zhiyuan You, Xinyi Le
arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.
By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen