arXiv Computer Vision By Jaron Yeh, Yen-Wei Chang, Jiang Liu, Shao-Yuan Lo

Industrial Anomaly Detection via Defect-Grounded Reasoning in Visual Latent Space

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The paper introduces Anomaly‑LR, a defect‑grounded latent reasoning framework for industrial anomaly detection that builds a global understanding of an image and then refines anomaly‑relevant representations directly in visual latent space. It also presents IAD‑LR‑22K, a new instruction dataset with 22,228 image‑question pairs and detailed annotations. Experiments demonstrate that Anomaly‑LR outperforms comparable‑scale methods on multiple IAD benchmarks without needing external references or tools.

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