arXiv:2605. 28021v2 Announce Type: replace Abstract: Out-of-distribution (OOD) detection is essential for deploying machine learning models in open-world and safety-critical scenarios, where test inputs may deviate from the training distribution and overconfident predictions on unknown samples can lead to unreliable decisions.
By Fengqiang Wan, Qing-Yuan Jiang, Fu Shen, Yang Yang
arXiv:2606. 26973v1 Announce Type: cross Abstract: Open-set semi-supervised learning aims to leverage unlabeled data that may contain out-of-distribution outliers while maintaining performance on in-distribution classes.
By Jiahe Chen, Qian Shao, Qiyuan Chen, Jiaying He, Jintai Chen, Jian Wu, Hongxia Xu
Detecting out-of-distribution (OOD) data is crucial for reliable machine learning deployment. Among detection strategies, post-hoc methods are particularly attractive due to their efficiency, as they operate directly on pre-trained networks without requiring retraining.
arXiv:2607. 12094v1 Announce Type: cross Abstract: Reliable detection of out-of-distribution (OOD) samples is crucial for the safe deployment of machine learning models.
By Ayush Karmacharya (Purdue University), Luke Luschwitz (Purdue University), Lucia Romero (Purdue University), Yanan Niu (EPFL), Joseph Campbell (Purdue University)
arXiv:2606. 29952v1 Announce Type: cross Abstract: Detecting out-of-distribution (OOD) data is crucial for reliable machine learning deployment.
By Seonghwan Park, Hyunji Jung, Dongyeop Lee, Namhoon Lee
arXiv:2503. 05169v2 Announce Type: replace Abstract: Applying machine learning to increasingly high-dimensional problems with sparse or biased training data increases the risk that a model is used on inputs outside its training domain.
By Felix Krumbiegel, Juniper Tyree, Michael Boy, Petri Clusius, Andreas Rupp