arXiv Machine Learning By Aditya Raghavan, Yu Liu, Ian Mercer, JP Maria, Sergei Kalinin

Multitask Scanning Probe Microscopy

Read the original on arXiv Machine Learning →

arXiv:2608. 09104v1 Announce Type: cross Abstract: Scanning probe microscopy provides nanoscale access to structural, electrical, electromechanical, magnetic, and mechanical properties of materials.

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