arXiv Machine Learning By Aditya Raghavan, Yu Liu, Ian Mercer, JP Maria, Sergei Kalinin

Multitask Scanning Probe Microscopy

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arXiv:2608. 09104v1 Announce Type: cross Abstract: Scanning probe microscopy provides nanoscale access to structural, electrical, electromechanical, magnetic, and mechanical properties of materials.

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arXiv AI
Jun 9

Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM

arXiv:2606. 09419v1 Announce Type: cross Abstract: Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and experimental context that shapes image formation.

By Jiadong Dan, Cheng Zhang, Leyi Loh, Ivan Verzhbitskiy, Yuan Chen, Goki Eda, Michel Bosman, N. Duane Loh