arXiv:2607. 22761v1 Announce Type: cross Abstract: Resolving Design Rule Violations (DRVs) in layouts entails an iterative loop of geometric edits and verification.
By Anushka Mukherjee, Kang He, Kaushik Roy
arXiv:2605. 06936v3 Announce Type: replace-cross Abstract: LLM-based agents are increasingly applied to the "last mile" of Electronic Design Automation (EDA): repairing residual sign-off Design Rule Check (DRC) violations and converging Power-Performance-Area (PPA) targets after tool runs.
By Pengju Liu, Nuo Xu, Jinwei Tang, Yu Cao, Caiwen Ding
arXiv:2608. 03738v1 Announce Type: new Abstract: As Moore's law slows, the industry is turning to three-dimensional integration; yet in merged 3D-IC flows, routed designs expose bond-level defects with no 2D analogue, and post-route engineering change orders (ECO) remain manual, expertise-bound work.
By Shuo Ren, Yaohui Han, Libo Shen, Zhiqiang Jia, Rongliang Fu, Bei Yu, Tsung-Yi Ho
arXiv:2605. 17450v2 Announce Type: replace-cross Abstract: As software systems grow increasingly complex, automated vulnerability repair (AVR) remains difficult because the materials available to a repair system are usually failure artifacts rather than repair guidance.
By Simiao Liu, Fang Liu, Peiding Wang, Taichuan Li, Yinghao Zhu, Xiaoli Lian, Li Zhang
The paper introduces a dictionary-guided HDL repair system that uses ANTLR-derived mutation vocabularies and a simulation-divergence fault localization module to generate syntactically valid Verilog mutations. The mutation operator performs token substitutions, insertions, and deletions via regex matching, while the fault localization scores source lines based on proximity to diverging output wires, guiding the search. Evaluated on the CirFix benchmark, the approach achieves correct repairs on 14 bug variants, including a multi-bug case, and outperforms CirFix with an 18x speedup on a two-edit benchmark.
By Maisha Mastora, Dean Sullivan
arXiv:2608. 03062v1 Announce Type: new Abstract: LLM-based CAD agents produce executable parametric programs, but their correction loops may lose evidence about satisfied requirements, faulty operations, and prior repairs.
By Fengxiao Fan, Jingzhe Ni, Fan Sang, Xiaolong Yin, Yu Liu, Ruofeng Tong, Min Tang, Peng Du