arXiv:2607. 12094v1 Announce Type: cross Abstract: Reliable detection of out-of-distribution (OOD) samples is crucial for the safe deployment of machine learning models.
By Ayush Karmacharya (Purdue University), Luke Luschwitz (Purdue University), Lucia Romero (Purdue University), Yanan Niu (EPFL), Joseph Campbell (Purdue University)
arXiv:2505. 15284v2 Announce Type: replace Abstract: Out-of-Distribution (OoD) detection is vital for the reliability of deep neural networks, the key of which lies in effectively characterizing the disparities between OoD and In-Distribution (InD) data.
By Kun Fang, Qinghua Tao, Mingzhen He, Kexin Lv, Runze Yang, Haibo Hu, Xiaolin Huang, Jie Yang, Longbing Cao
arXiv:2503. 05169v2 Announce Type: replace Abstract: Applying machine learning to increasingly high-dimensional problems with sparse or biased training data increases the risk that a model is used on inputs outside its training domain.
By Felix Krumbiegel, Juniper Tyree, Michael Boy, Petri Clusius, Andreas Rupp
Detecting out-of-distribution (OOD) data is crucial for reliable machine learning deployment. Among detection strategies, post-hoc methods are particularly attractive due to their efficiency, as they operate directly on pre-trained networks without requiring retraining.
arXiv:2311. 02960v5 Announce Type: replace Abstract: Over the past decade, deep learning has proven to be a highly effective tool for learning meaningful features from raw data.
By Peng Wang, Xiao Li, Can Yaras, Zhihui Zhu, Laura Balzano, Wei Hu, Qing Qu
arXiv:2402. 13425v3 Announce Type: replace-cross Abstract: It is becoming increasingly common in regression to train neural networks that model the entire distribution even if only the mean is required for prediction.
By Ehsan Imani, Kai Luedemann, Sam Scholnick-Hughes, Esraa Elelimy, Martha White