The paper introduces WaferHDC, an online open‑world wafer defect discovery framework that uses hyperdimensional computing to detect and group new defect signatures without retraining. It models normal spatial distributions and dynamically creates persistent defect memory, scaling with new defect modes. On the WM‑811K dataset, WaferHDC outperforms the strongest online baseline by 13.3 p.p. in adjusted Rand index and 10.5 p.p. in normalized mutual information.
By Quanling Zhao, Ava Emami, Tsuyoshi Id\'e, Rajiv Joshi, Steven Holmes, Michael Passow, Tajana Rosing
arXiv:2610.19540v1 Announce Type: new
Abstract: Automated defect detection of industrial boards must remain highly reliable under cross-scenario variations in lighting, surface contaminants, and prod...
By Dikai Li, Weijia Wang, Yuan-Gen Wang
NV-Tesseract-AD is a curriculum learning‑enhanced conditional diffusion framework designed for multivariate time‑series anomaly detection. It structures reconstruction difficulty along masking severity and diffusion noise level, using a Transformer‑based diffusion backbone and a three‑stage dual curriculum that keeps anomalous samples throughout training. The method achieves significant performance gains, including a 3.7‑fold F1 improvement and 56% MSE reduction over a non‑curriculum baseline, and demonstrates strong zero‑shot results on several benchmark families.
By Aditi Gautam, Manikandan Ravikiran, Saira Qureshi, Sena Fatma Ekiz, Charan Jagwani, Mahmoud Elhadidy, Sanjeev Roka
The paper introduces Contrastive Dual Gaussian Processes (CDGP), a weakly supervised approach for anomaly segmentation in industrial visual inspection. CDGP models normal and anomaly predictive distributions over dense tokens, using a posterior-dominance statistic that normalizes predictive-mean differences by joint uncertainty to provide spatial evidence and image-level confidence. The method achieves top performance on MVTec AD~2, KSDD2, and VisA datasets without requiring pixel-level annotations or test-time fitting.
arXiv:2606. 02601v1 Announce Type: new Abstract: Within-dataset class-split evaluation is widely used as a proxy for fully unconditional out-of-distribution anomaly detection.
By Alejandro Ascarate, Leo Lebrat, Rodrigo Santa Cruz, Clinton Fookes, Olivier Salvado
The paper introduces a training‑free anomaly detector that simultaneously handles structural and logical defects by calibrating heterogeneous anomaly cues with statistics from normal images. This calibration aligns frozen representations, allowing their fusion without extra training or part‑level supervision. The resulting method achieves state‑of‑the‑art AUROC scores on MVTec‑LOCO and remains competitive on MVTec‑AD.
By Changyi Li, Miao Yu, Kai Dong, Yu Xiao
arXiv:2608.23295v1 Announce Type: new
Abstract: Memory-based anomaly detectors store nominal training patches and score test patches against this memory. A patch selected for coverage therefore becom...
By Joongwon Chae, Runming Wang, Peiwu Qin
arXiv:2409. 10094v3 Announce Type: replace-cross Abstract: Out-of-Distribution (OoD) detection aims to justify whether a given sample is from the training distribution of the classifier-under-protection, i.
By Kun Fang, Zuopeng Yang, Haibo Hu, Xiaolin Huang, Jie Yang, Qinghua Tao
Generative Verification introduces an active learning strategy for object detection that uses an independent generative model to re‑derive a detection’s label from the pixels inside its predicted box. The disagreement between the detector’s label and the verifier’s label serves as the acquisition signal, automatically combining localization and classification errors into a single scalar and eliminating the need for hand‑weighted terms. Experiments on PASCAL VOC and MS‑COCO show that this signal outperforms traditional uncertainty and ensemble criteria, improving mAP50 by about one point per round, especially in early rounds where confident detector errors are most common.
By Licheng Zhang, Zheng Gong
arXiv:2608.29112v1 Announce Type: new
Abstract: Recent advances in anomaly detection (AD) for industrial inspection have pushed performance on standard benchmarks toward saturation. However, strong b...
By Dat Cao, Son Nghiem, Phan Nguyen, Jun Rekimoto, Jhih-Ciang Wu
arXiv:2608.23299v1 Announce Type: new
Abstract: Memory-based anomaly detectors store nominal training patches and score test patches against this memory. A patch selected for coverage therefore becom...
By Joongwon Chae, Runming Wang, Peiwu Qin
SPARC is a few‑shot calibration technique for vision‑based industrial anomaly detectors that corrects deployment‑time nuisances by projecting patch features onto a per‑cell subspace, requiring only up to eight verified‑normal images and no gradient updates. It operates between the encoder and detector, using a closed‑form, spatially indexed estimate based on the encoder’s native patch grid. Across seven detectors on shift‑prone benchmarks, SPARC boosts pooled Image AUROC by 13.8 pp and AU‑PRO₀.₃ by 3.5 pp, while showing modest changes on benchmarks without engineered shift.