arXiv AI
Jun 24
VeriPilot: An LLM-Powered Verilog Debugging Framework
arXiv:2606. 23759v1 Announce Type: cross Abstract: Verilog debugging remains one of the most time-consuming stages in digital circuit design.
LAUDE: LLM-Assisted Unit Test Generation and Debugging of Hardware DEsigns
arXiv:2601. 08856v3 Announce Type: replace-cross Abstract: Unit tests are critical in the hardware design lifecycle to ensure that component design modules are functionally correct and conform to the specification before they are integrated at the system level.
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arXiv AI
Jun 15
VHDLSuite: Unified Pipeline for LLM VHDL Generation with Data Synthesis and Evaluation
arXiv:2606. 13735v1 Announce Type: cross Abstract: Large Language Models (LLM) have shown impressive capabilities in Register Transfer Level (RTL) code generation, particularly for Verilog.
arXiv Machine Learning
Jul 28
Benchmarking LLMs for Verilog Design Flows
arXiv:2607. 22759v1 Announce Type: cross Abstract: Large language models (LLMs) show promise in code generation, but their capabilities to produce correct, synthesizable hardware description language (HDL) code still remain to be properly benchmarked.
arXiv AI
Jun 9
RTL-BenchLS: A Large-Scale Benchmark for RTL Reasoning and Generation with Large Language Models
arXiv:2606. 08976v1 Announce Type: new Abstract: LLM-based RTL generation and reasoning is a promising direction for hardware design automation.
arXiv AI
Jun 19
Interpretable and Verifiable Hardware Generation with LLM-Driven Stepwise Refinement
arXiv:2606. 19387v1 Announce Type: cross Abstract: Large language models (LLMs) have achieved remarkable success in software development.
arXiv AI
Jun 16
LLM4RTL: Tool-Assisted LLM for RTL Generation
arXiv:2606. 15500v1 Announce Type: cross Abstract: Large language models (LLMs) have facilitated impressive progress in software engineering, code generation, tooling, and systems.
arXiv AI
Jun 19
Library-Aware Doubles and Iterative Repair for Large Language Model-Generated Unit Tests in OpenSIL Firmware
arXiv:2606. 19725v1 Announce Type: cross Abstract: Validating changes in low-level C firmware is expensive because unit tests (UTs) are fragile under strict build constraints, where missing headers, unresolved symbols, and dependency mismatches frequently prevent compilation and linking.
arXiv AI
Jul 14
TENET: One Step Toward Test-Driven Development for Repository-Level Code Generation
arXiv:2509. 24148v3 Announce Type: replace-cross Abstract: Test-Driven Development (TDD) is a widely adopted practice that requires developers to create and execute tests alongside implementation.
arXiv Machine Learning
Jun 5
LLMs for Secure Hardware Design and Related Problems: Opportunities and Challenges
arXiv:2605. 10807v4 Announce Type: replace-cross Abstract: The integration of Large Language Models (LLMs) into Electronic Design Automation (EDA) and hardware security is rapidly reshaping the semiconductor industry.
arXiv AI
Jul 28
Evaluating and Mitigating the Misguidance Effect of Buggy Code in LLM-Generated Unit Tests
arXiv:2607. 22883v1 Announce Type: cross Abstract: While Large Language Models (LLMs) show great promise for automating unit test generation, recent studies suggest that the quality of generated tests can be negatively impacted when models are prompted with buggy code.
arXiv AI
Jun 12
Structured Testbench Generation for LLM-Driven HDL Design and Verification-Oriented Data Curation
arXiv:2606. 12983v1 Announce Type: new Abstract: Automated testbench generation has become a critical bottleneck in large language model (LLM)-driven Register Transfer Level (RTL) workflows, where large numbers of candidate designs must be verified rapidly and reliably.
arXiv AI
Jun 19
How LLMs Fail and Generalize in RTL Coding for Hardware Design?
arXiv:2606. 19347v1 Announce Type: cross Abstract: Translating sequential programming priors into the parallel temporal logic of hardware design remains a crucial bottleneck for large language models(LLM).