arXiv AI

LAUDE: LLM-Assisted Unit Test Generation and Debugging of Hardware DEsigns

arXiv:2601. 08856v3 Announce Type: replace-cross Abstract: Unit tests are critical in the hardware design lifecycle to ensure that component design modules are functionally correct and conform to the specification before they are integrated at the system level.

arXiv AI
Aug 20

Large Language Model for Verilog Code Generation: Literature Review and the Road Ahead

The article reviews the growing use of Large Language Models (LLMs) for generating Verilog code, a key hardware description language in electronic design automation. It surveys 102 papers, covering conferences, journals, and preprints, and addresses four research questions about LLM selection, datasets, techniques, and alignment strategies. The review identifies current limitations and proposes a roadmap for future research in LLM-assisted hardware design.

By Guang Yang, Wei Zheng, Xiang Chen, Dong Liang, Peng Hu, Yukui Yang, Shaohang Peng, Zhenghan Li, Jiahui Feng, Xiao Wei, Kexin Sun, Deyuan Ma, Haotian Cheng, Yiheng Shen, Xing Hu, Terry Yue Zhuo, David Lo
arXiv Machine Learning
Jul 28

Benchmarking LLMs for Verilog Design Flows

arXiv:2607. 22759v1 Announce Type: cross Abstract: Large language models (LLMs) show promise in code generation, but their capabilities to produce correct, synthesizable hardware description language (HDL) code still remain to be properly benchmarked.

By Angshuman Chakravertty, Rahul Koshti, Buddhi Prakash Sharma, Vinay Chamola
arXiv AI
Jun 19

Library-Aware Doubles and Iterative Repair for Large Language Model-Generated Unit Tests in OpenSIL Firmware

arXiv:2606. 19725v1 Announce Type: cross Abstract: Validating changes in low-level C firmware is expensive because unit tests (UTs) are fragile under strict build constraints, where missing headers, unresolved symbols, and dependency mismatches frequently prevent compilation and linking.

By Ma Toan Bach, Yuchi Zheng, Haingo Razafindranto, Tanvir Alam, Aric Leather, Ranveer Sandhu, Jitesh Arora
arXiv AI
Jun 12

Structured Testbench Generation for LLM-Driven HDL Design and Verification-Oriented Data Curation

arXiv:2606. 12983v1 Announce Type: new Abstract: Automated testbench generation has become a critical bottleneck in large language model (LLM)-driven Register Transfer Level (RTL) workflows, where large numbers of candidate designs must be verified rapidly and reliably.

By En-Ming Huang, Yu-Hung Kao, Ren-Hao Deng, Wei-Po Hsin, Yao-Ting Hsieh, Cheng Liang, Hsiang-Yu Tsou, Mu-Chi Chen, Yu-Kai Hung, Shao-Chun Ho, Po-Hsuang Huang, Shih-Hao Hung, H. T. Kung