arXiv:2608. 05063v1 Announce Type: cross Abstract: The semiconductor industry is undergoing a dual revolution: the shift toward heterogeneous 2.
By Johann Knechtel, Ozgur Sinanoglu, Paul V. Gratz, Ramesh Karri
arXiv:2606. 15123v1 Announce Type: cross Abstract: We study the task of CVE-conditioned exploit generation, where a model drafts proof-of-concept (PoC) exploits given software vulnerability context.
By Yiwei Chen, Lichi Li, Kai Cheung, Vinny Parla, Ganesh Sundaram
arXiv:2606. 19387v1 Announce Type: cross Abstract: Large language models (LLMs) have achieved remarkable success in software development.
By You Li, Samuel Mandell, David Z. Pan
arXiv:2607. 23088v1 Announce Type: cross Abstract: Large Language Models (LLMs) are widely used for code generation, yet their security behavior in realistic development workflows remains underexplored.
By Lixun Ma, Ruolong Ma, Bei Wang, Feng Wei, Zhenguang Liu, Lorenzo Cavallaro, Wentao Chen
arXiv:2601. 08856v3 Announce Type: replace-cross Abstract: Unit tests are critical in the hardware design lifecycle to ensure that component design modules are functionally correct and conform to the specification before they are integrated at the system level.
By Deeksha Nandal, Riccardo Revalor, Soham Dan, Debjit Pal
arXiv:2602. 06911v2 Announce Type: replace-cross Abstract: As increasingly capable open-weight large language models (LLMs) are deployed, improving their tamper resistance against unsafe modifications, whether accidental or intentional, becomes critical to minimize risks.
By Saad Hossain, Tom Tseng, Punya Syon Pandey, Samanvay Vajpayee, Matthew Kowal, Nayeema Nonta, Samuel Simko, Stephen Casper, Zhijing Jin, Kellin Pelrine, Sirisha Rambhatla