arXiv:2601. 05680v2 Announce Type: replace-cross Abstract: While Transformer-based autoregressive models excel in data generation, their token discretization strategy inherently limits their precision in continuous domains.
By Yeonsang Shin, Insoo Kim, Bongkeun Kim, Keonwoo Bae, Bohyung Han
arXiv:2608. 12671v1 Announce Type: new Abstract: Multi-layer transformers form the critical component of essentially all large language models (LLMs) in use today.
By Phokion Kolaitis, Rik Sengupta
arXiv:2510. 23472v2 Announce Type: replace-cross Abstract: Chip placement is a vital stage in modern chip design, and black-box optimization (BBO) has been applied to it for decades.
By Ke Xue, Ruo-Tong Chen, Rong-Xi Tan, Xi Lin, Yunqi Shi, Siyuan Xu, Mingxuan Yuan, Chao Qian
arXiv:2608. 08048v1 Announce Type: cross Abstract: This paper presents, for the first time in power systems literature to our knowledge, analytical tools to explain the training performance of machine learning surrogate models for power system dynamics.
By Petros Ellinas, Johanna Vorwerk, Spyros Chatzivasileiadis
arXiv:2608. 13260v1 Announce Type: new Abstract: Accurate modeling and forecasting of power transformer thermal behavior are critical for reliability, asset lifetime, and optimized power system operation.
By Berk Hadzhamolla, Alexander Johannes Stasik, Signe Riemer-S{\o}rensen
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
By Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi