arXiv AI By Shuimu Chen, Jing Jin, Nan Su, Hongbo Xu, Zebang Cheng, Wenming Yang, Fei Ma, Guijin Wang

OPD-IAD: From Language Judgment to Industrial Anomaly Detection via On-Policy Self-Distillation

Read the original on arXiv AI →

arXiv:2607. 18850v1 Announce Type: cross Abstract: Large vision-language models (LVLMs) have recently shown strong potential for industrial anomaly detection (IAD) by providing image-level anomaly judgments and interpretable defect reasoning.

Summary generated by The Flow from the publisher's feed. The full article lives at arXiv AI.

arXiv AI
Jun 9

Unification of Closed-Open Industrial Detection Scenarios: New Large-Scale Benchmarks,Challenges and Baselines

arXiv:2606. 07953v1 Announce Type: new Abstract: Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding.

By Zekai Zhang, Jinglin Zhang, Qinghui Chen, Gang Li, Da Chen, Shuainan Jing, He Wang, Dagang Li, Cong Liu, Cong Bai, Shengyong Chen