Differentiable Jitter Correction using Deep Learning-based Image Quality Metric for Phase-Contrast Micro-CT

This paper introduces a fully differentiable jitter correction technique for X‑ray phase‑contrast micro‑CT that uses a deep learning‑based image quality metric to estimate and compensate per‑projection rigid jitter directly from the acquired data, eliminating the need for a motion‑free reference scan. The method adapts a gradient‑based auto‑focus strategy to parallel‑beam geometry, benchmarks several objective functions, and validates the sensitivity of the visual information fidelity (VIF) metric to jitter artifacts. A compact 3D CNN predicts VIF scores from corrupted volumes, while a spatially selective total variation penalty suppresses spurious high‑frequency structures during optimization; experiments on biological specimens from multiple synchrotron beamlines confirm that the pipeline reliably restores fine structural detail across morphologically distinct samples.

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