arXiv:2606. 08976v1 Announce Type: new Abstract: LLM-based RTL generation and reasoning is a promising direction for hardware design automation.
By Jing Wang, Shang Liu, Wenji Fang, Yuchao Wu, Yugao Zhu, Zhiyao Xie
The paper introduces NeuroAssertion, a coverage-driven framework for generating RTL assertions that integrates formal trace generation, syntax-guided synthesis, and a two-step large language model (LLM) refinement process. It transforms hard-to-reach control-flow conditions into formal reachability goals, uses model checking to produce diverse traces, and mines initial assertions via SyGuS. The refinement stage employs one LLM to propose candidate assertions for uncovered regions and a second LLM to generate repair grammars that guide symbolic synthesis, resulting in roughly twice as many assertions and higher mutation coverage compared to traditional methods.
By Zhiyuan Yan, Ziyue Zheng, Hongce Zhang
arXiv:2607. 28877v1 Announce Type: cross Abstract: Verification consumes the majority of modern chip design effort, yet the formal verification tools that provide mathematical guarantees of correctness remain expensive and restrictively licensed.
By Ha Trung Tran
arXiv:2607. 22759v1 Announce Type: cross Abstract: Large language models (LLMs) show promise in code generation, but their capabilities to produce correct, synthesizable hardware description language (HDL) code still remain to be properly benchmarked.
By Angshuman Chakravertty, Rahul Koshti, Buddhi Prakash Sharma, Vinay Chamola
CovR is an agentic framework that automates testbench generation for hardware verification by combining self-reflection loops with simulation-based feedback to maximize coverage. It builds a large dataset of 16,514 specification–RTL reasoning tuples and uses reinforcement learning with tool-derived rewards to train a student model, achieving high coverage scores on VerilogEval, RTLLM V2.0, and CVDP. When deployed as a plug-in stimulus engine, CovR boosts coverage by nearly 19% and improves mutation detection while uncovering previously undetected failures.
By Manar Abdelatty, Maryam Nouh, Sherief Reda
arXiv:2607. 26181v1 Announce Type: new Abstract: Functional verification dominates integrated circuit (IC) front-end engineering effort, and a single missed bug that escapes to silicon can trigger a costly respin.
By Xin Xin, Jincheng Lou, Junhui Li, Jinglin Yan, Panda Xiao, Di Wu, Haixiao Li, Weicong Lu, Weijian Fan, Xinyu Qu, Yuxiang Zhao, Min Yu, Zhixiong Di, Yibo Lin