arXiv Machine Learning By Yuha Park, Yongdai Kim

A nonparametric two-sample test using a parametric integral probability metric

Read the original on arXiv Machine Learning →

arXiv:2606. 16941v1 Announce Type: cross Abstract: Detecting distributional differences between two independent samples is a fundamental problem in statistics and machine learning.

Summary generated by The Flow from the publisher's feed. The full article lives at arXiv Machine Learning.

arXiv Machine Learning
Jul 24

Zero-Flow Two-Sample Tests

arXiv:2607. 21542v1 Announce Type: new Abstract: We propose a new approach to two-sample testing for deciding whether two sets of samples are drawn from the same distribution.

By Yakun Wang, Leyang Wang, Song Liu, Taiji Suzuki