arXiv Computer Vision

Catastrophic Forgetting in Sequential Thermal Anti-UAV Detection: The Role of Scale-Conditioned Gradient Imbalance

arXiv Computer Vision
Sep 3

Evidential Deep Learning for Multi-Modal Anti-UAV Detection

The paper investigates the use of evidential deep learning (EDL) for multi‑modal anti‑UAV detection, comparing it with sigmoid baselines, Dempster‑Shafer evidence fusion, and uncertainty‑driven temporal sensor gating across three benchmarks (thermal tracking, RGB‑audio‑RF classification, and RGB‑IR tracking). EDL improves accuracy by up to 5.9 percentage points and better ranks classification errors, while the other components (DS fusion, Dirichlet vacuity, temporal gating) do not provide the expected benefits. The study concludes that the primary advantage of EDL stems from its training objective rather than its uncertainty estimates.

By Dmitry Golovchits, Seyed Sahand Mohammadi Ziabari, Ali Mohammed Mansoor Alsahag
arXiv Computer Vision
Sep 28

CSCWD: Cross-Scale Channel-wise Knowledge Distillation for Lightweight Tiny Object Detection on Edge Devices

The paper introduces Cross-Scale Channel-wise Knowledge Distillation (CSCWD), a training-time framework that transfers high‑resolution spatial representations from a YOLO11m‑P2 teacher to a lightweight YOLO11n student without changing the student’s inference architecture. CSCWD aligns teacher P2 features with student P3 while also applying same‑scale distillation at deeper pyramid levels, yielding a 2.92‑point mAP@0.5 improvement over the baseline and a 2.09‑point gain over same‑scale distillation alone. In zero‑shot tests on DUT‑Anti‑UAV and on a Raspberry Pi 5, the 2.58‑million‑parameter student reaches 50.32% mAP@0.5 at 82.32 ms latency (12.15 fps) with negligible runtime or memory increase.

By Amir Zamani, Zeinab Ghasemi-Naraghi
arXiv AI
Jun 3

PURGE: Projected Unlearning via Retain-Guided Erasure

arXiv:2606. 03808v1 Announce Type: cross Abstract: We propose PURGE, a machine unlearning algorithm built on a simple but an under-exploited observation: continual learning (CL) and machine unlearning (MU) which are fundamentally dual problems.

By Vedant Jawandhia, Daksh Ahuja, Ghufran Alam Siddiqui, Prashant Trivedi, Yash Sinha, Pratik Narang