arXiv Machine Learning

Mitigating Spurious Correlations with Memorization-Guided Dataset De-Biasing

arXiv:2606. 02830v1 Announce Type: new Abstract: Real-world datasets often contain spurious correlations that are not causally related to the target label.

arXiv Machine Learning
Aug 11

UNMASK: Discovering and Causally Verifying Spurious Shortcuts in Text Classifiers

arXiv:2608. 09209v1 Announce Type: cross Abstract: Neural language models trained on large crowdsourced corpora frequently exploit spurious surface patterns tied to target labels without true linguistic or causal relevance, boosting benchmark performance while failing on adversarial or out-of-distribution inputs.

By Chidaksh Ravuru, Shashank Srivastava
Hugging Face Trending Papers
Aug 10

UNMASK: Discovering and Causally Verifying Spurious Shortcuts in Text Classifiers

Neural language models trained on large crowdsourced corpora frequently exploit spurious surface patterns tied to target labels without true linguistic or causal relevance, boosting benchmark performance while failing on adversarial or out-of-distribution inputs. Existing approaches either require manual specification of the feature vocabulary or automate discovery only partially, leaving the gap between dataset-level correlation and model-level exploitation unaddressed.

arXiv AI
Aug 12

Token-Based Detection of Spurious Correlations in Vision Transformers

arXiv:2509. 04009v2 Announce Type: replace-cross Abstract: Due to their powerful feature association capabilities, neural network-based computer vision models have the ability to detect and exploit unintended patterns within the data, potentially leading to correct predictions based on incorrect or unintended but statistically relevant signals.

By Solha Kang, Esla Timothy Anzaku, Wesley De Neve, Arnout Van Messem, Joris Vankerschaver, Francois Rameau, Utku Ozbulak
arXiv Machine Learning
Jul 21

AOE: Exhaustive Out-of-Distribution Detection via Recalibrating Outlier Labels

arXiv:2605. 28021v2 Announce Type: replace Abstract: Out-of-distribution (OOD) detection is essential for deploying machine learning models in open-world and safety-critical scenarios, where test inputs may deviate from the training distribution and overconfident predictions on unknown samples can lead to unreliable decisions.

By Fengqiang Wan, Qing-Yuan Jiang, Fu Shen, Yang Yang