arXiv:2606. 19605v1 Announce Type: cross Abstract: Multi-step LLM pipelines fail through interactions among retrieval, reasoning, and formatting steps, so prompt-only optimization can miss bottlenecks in the chain.
By Paul Kassianik, Baturay Saglam, Huaibo Zhao, Blaine Nelson, Supriti Vijay, Aman Priyanshu, Amin Karbasi
arXiv:2606. 09118v1 Announce Type: new Abstract: As LLM capabilities advance rapidly, the evaluation methods used to assess them increasingly lag behind.
By Sushant Mehta, Liudas Panavas, Edwin Chen
arXiv:2608. 00316v1 Announce Type: new Abstract: Bayesian optimization (BO) has become the standard tool for sample-efficient optimization and owes its efficiency to uncertainty-aware search driven by generic statistical priors.
By Paul Brunzema, Louis Tiao, Nhat Le, Kevin De Angeli, Yao Xuan, Djordje Gligorijevic
arXiv:2608. 04336v1 Announce Type: cross Abstract: Code generation systems make each LLM call with a model, a prompt, and decoding settings.
By Jingzhi Gong, Jie M. Zhang, Gunel Jahangirova, Dong Huang, Mohammad Reza Mousavi, Mark Harman
arXiv:2602. 00510v2 Announce Type: replace Abstract: Most LLM code-synthesis benchmarks rely on unit tests as the reward oracle, but PCB schematic design has none: correctness is defined by structured physical constraints over real IC packages and pin-level assignments, per-task golden references are unavailable, and SPICE simulation does not validate schematic-level correctness.
By Huanghaohe Zou, Peng Han, Emad Nazerian, Mafu Zhang, Zhicheng Guo, Alex Q. Huang
ChipMEM introduces a verification‑grounded memory layer for electronic design automation agents that combines cross‑task procedural memory with within‑trajectory statistical guidance. The procedural component stores a skill only after it passes synthesis, simulation, or formal checks, while a Bayesian component ranks recovery strategies based on tool‑call outcomes. Experiments on RTLRewriter‑Bench and CVDP tasks show that ChipMEM improves equivalence‑passing outputs and area metrics compared to agents without memory.
By Abdulrahman AlRabah, Joshua Mabry, Dilek Hakkani-T\"ur, Abdussalam Alawini, Hamid Shojaei, Kartik Hegde, Sandesh Adhikary
The paper addresses the failure of large language models (LLMs) in code generation when routine correctness relies on execution-dependent coupling—situations where the meaning of one routine depends on another’s runtime behavior. It introduces a dynamic context adaptation framework that iteratively validates generated code, extracts diagnostic information from execution traces, and guides generation using a knowledge graph and simulated annealing. Experiments show the method surpasses zero‑shot, Reflexion, and OpenEvolve on most benchmark problems, especially where runtime coupling is critical.
By Gnaneswar Villuri, Hashmath Shaik, Alex Doboli
The paper introduces KOPE, an experience‑driven framework that records hardware kernel optimization trajectories in an Experience Graph Memory and uses Active Context Management and Injection to retrieve relevant past decisions under a fixed token budget. KOPE preserves decision order, outcomes, and alternative branches, enabling evidence from completed runs to inform future optimization steps. In experiments, KOPE achieves a 1.54× speedup over the strongest baseline, raises pass rates from 60.0% to 84.6%, and reduces token consumption dramatically, demonstrating the benefits of continual learning from external experience while keeping the foundation model unchanged.
By Siyuan Chen, Runlin Hou, Shenxiu Wu, Yansong Sun, Junming Cao, Yiyu Zhang, Shudi Shao, Junhao Qiu, Zhichao Lu, Qingfu Zhang
arXiv:2608.23601v1 Announce Type: cross
Abstract: EDA flow parameter tuning is critical for quality-of-results~(QoR), yet the parameter space is large, tightly coupled, and full evaluations are prohi...
By Kunlong Li, Shangshang Yao, Su Zheng, Lingli Wang
arXiv:2606. 25207v1 Announce Type: new Abstract: Hyperparameter Optimization (HPO) is essential for maximizing machine learning model performance, and its core challenge is sample efficiency: finding strong configurations within a limited budget.
By Taicheng Guo, Haomin Zhuang, Kehan Guo, Yujun Zhou, Nitesh V. Chawla, Olaf Wiest, Xiangliang Zhang
arXiv:2603. 13092v2 Announce Type: replace Abstract: Yield Multi-Corner Analysis validates circuits across 25+ Process-Voltage-Temperature corners, resulting in a combinatorial simulation cost of $O(K \times N)$ where $K$ denotes corners and $N$ exceeds $10^4$ samples per corner.
By Wei W. Xing, Kaiqi Huang, Jiazhan Liu, Hong Qiu, Shan Shen
arXiv:2608.23830v1 Announce Type: cross
Abstract: RL has emerged as a powerful paradigm for enhancing the instruction following capabilities of LLMs. While existing training recipes achieve substanti...
By Mian Zhang, Yueqin Yin, Kaiyu He, Peilin Wu, Xinlu Zhang, Mingyuan Zhou, Zhiyu Zoey Chen