arXiv AI By Dhiraj Neupane, Mohamed Reda Bouadjenek, Richard Dazeley, Sunil Aryal

Label-free Industrial Fault Detection via Adversarial Inverse Reinforcement Learning: A System for Run-to-Failure Prognostics

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arXiv:2607. 22987v1 Announce Type: cross Abstract: Machinery fault detection (MFD) remains heavily reliant on supervised learning, which struggles with the scarcity of fault labels in real-world settings.

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