arXiv:2606. 08161v1 Announce Type: new Abstract: As capacitance extraction accuracy of rule-based pattern matching becomes difficult to sustain at advanced nodes, a growing trend emerges to develop deep-learning-based 2D capacitance models.
By Jiechen Huang, Hector R. Rodriguez, Dingcheng Yang, Zuochang Ye, Yibo Lin, Wenjian Yu
arXiv:2607. 23225v1 Announce Type: new Abstract: As chip manufacturing processes advance to deep submicron nodes, parasitic interconnect effects increasingly dominate the performance of analog and mixed-signal (AMS) circuits and often lead to costly layout iterations.
By Jiajun Zou, Jiawei Liu, Ao Liu, Junnong Tian, Yibin Zhang, Chengjie Liu, Yuxi Wang, Shan Shen, Wenhua Gu, Jun Yang, Wenjian Yu
arXiv:2505. 03303v4 Announce Type: replace-cross Abstract: Lightweight convolutional neural networks are often compared using results obtained with different training recipes, input settings, and pretrained checkpoints.
By Tasnim Shahriar
arXiv:2505. 03303v3 Announce Type: replace-cross Abstract: Lightweight convolutional neural networks are often compared using results obtained with different training recipes, input settings, and pretrained checkpoints.
By Tasnim Shahriar
arXiv:2607. 01984v1 Announce Type: cross Abstract: Newer lightweight convolutional neural networks are often presented as improving predictive performance and deployment efficiency, but such claims require controlled evaluation.
By Tasnim Shahriar
arXiv:2608. 03913v1 Announce Type: new Abstract: Dense pretrained transformers do not naturally expose interpretable units for circuit extraction.
By Chuanhao Yan, Xuhan Huang, Yawen Duan, Zhenfei Yin, Hang Zhao, Bryan Dai, Jie Fu