TreeFI is a value‑aware statistical fault‑injection technique for FP32 single‑bit faults in deep neural network activations and weights. It partitions each layer’s value distribution into intervals with similar expected bit‑flip behavior using regression trees, then allocates injections across these intervals based on their relevance for failure‑rate estimation. This stratified approach preserves target confidence and error margins while dramatically reducing the required injection budget—up to 72.1× for activations and 11.2× for weights compared to existing baselines.
By Noam Bires, Marcello Traiola, Angeliki Kritikakou, Elisa Fromont
arXiv:2607. 12868v1 Announce Type: cross Abstract: Deep learning systems often fail due to subtle implementation faults that alter training behavior.
By Sigma Jahan
arXiv:2607. 11193v1 Announce Type: cross Abstract: To ensure the overall quality of AI-enabled software, not only traditional software components but also AI components need to be tested and repaired.
By Yuta Ishimoto, Paolo Arcaini, Fuyuki Ishikawa, Masanari Kondo, Naoyasu Ubayashi, Yasutaka Kamei
arXiv:2608. 04173v1 Announce Type: new Abstract: Deep neural networks (DNNs) deployed on resource-constrained neuromorphic hardware face three concurrent challenges: the need for model compression through pruning, vulnerability to adversarial input perturbations, and susceptibility to hardware-induced weight faults such as stuck-at-zero errors.
By Manali Dangarikar, Cory Merkel
arXiv:2603. 22770v2 Announce Type: replace-cross Abstract: The deployment of deep neural networks (DNNs) in safety-critical edge environments necessitates robustness against hardware-induced bit-flip errors.
By Alan T. L. Bacellar, Sathvik Chemudupati, Shashank Nag, Allison Seigler, Priscila M. V. Lima, Felipe M. G. Fran\c{c}a, Lizy K. John
arXiv:2606. 06536v1 Announce Type: cross Abstract: Automated defect detection in high-voltage transmission-line insulators remains challenging due to severe class imbalance, large scale variation, and the small spatial extent of defect instances in Unmanned Aerial Vehicle (UAV) imagery.
By Malak Allam, Khaled Shaban, Ali Hamdi