arXiv AI By Sen Xu, Wei Wang, Shixi Liu, Jixin Min, Yingwei Dai, Zhibin Yin, Yirong Chen, Junlin Zhang

Claim-Level Reliability Assessment for Efficient Test-Time Reasoning

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arXiv:2608. 11994v1 Announce Type: new Abstract: We propose claim-level falsification as a principle for test-time scaling and instantiate it through Claim-Level Reliability Assessment (CLR), a training-free framework that reallocates test-time compute from additional solution sampling to targeted verification.

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