arXiv:2608. 01615v1 Announce Type: cross Abstract: We present a set of tools for mapping general stochastic programs to thermodynamic hardware designed for energy-efficient stochastic sampling.
By Mirko Amico, Andra\v{z} Jelin\v{c}i\v{c}, Colin Oscar Nancarrow, Leo Tyrpak, David Roberts, Seth Morton, Dalton Sakthivadivel, Ashwin Gopal, Guillaume Verdon
arXiv:2606. 27294v1 Announce Type: cross Abstract: Analog hardware platforms such as coupled oscillators and Analog Ising Machines naturally solve differential equations at a fraction of the energy cost of digital computation, making them attractive for low-power generative modeling, yet a fundamental mismatch exists: modern generative models assume flexible, software-defined dynamics, whereas analog hardware imposes fixed, physics-determined differential equations with limited approximation capacity.
By Yu-Neng Wang, Sara Achour
Thermodynamic computing devices based on the Ising model show great promise for low-power AI inference and edge computing, but scalable methods for training large models for such hardware remain limited. Prior theory shows that the time-averaged behavior of high-temperature Gibbs-sampled Ising systems can implement feed-forward neural inference.
arXiv:2607. 00170v1 Announce Type: cross Abstract: Thermodynamic computing devices based on the Ising model show great promise for low-power AI inference and edge computing, but scalable methods for training large models for such hardware remain limited.
By Andrew G. Moore
arXiv:2606. 04582v1 Announce Type: cross Abstract: Real-time monitoring of the temperature distribution within components and sub-structures is a challenging topic in many systems due to restrictions on feasible sensor locations.
By Monika Stipsitz, H\`elios Sanchis-Alepuz, Jacob Reynvaan, Silvester Sabathiel
arXiv:2607. 05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly threatened by the combined stochastic effects of Bias Temperature Instability (BTI) and Process Variation (PV).
By Arash Esshaghi, Siavash Es'haghi, Gholamreza Shahabadi, Alireza Moradi