arXiv:2606. 04767v1 Announce Type: new Abstract: The robustness of deep neural networks is crucial for safety-critical deployments, yet existing evaluation methods are often attack-dependent and lack interpretability.
By Chong Zhang, Xiang Li, Jia Wang, Qiufeng Wang, Xiaobo Jin
The paper introduces Sparsity-Adaptive Sharpness-Aware Minimization (SA‑SAM), a method that adjusts the perturbation radius in sharpness-aware training to remain consistent as model sparsity increases. It also evaluates a Magnitude‑Weighted Hessian (MWH) importance metric derived from second‑order analysis. Experiments on CIFAR‑10‑C, CIFAR‑100‑C, and ImageNet‑100‑C show that SA‑SAM improves corruption robustness at 80–90% sparsity while maintaining clean accuracy, and the study reports inference throughput at deployment‑relevant sparsity levels.
By Shiryu Ueno, Yoshikazu Hayashi, Kunihito Kato
arXiv:2606. 16883v1 Announce Type: cross Abstract: Generalization is a critical property of data-driven models, particularly deep learning models deployed in safety-critical applications.
By Abdul-Rauf Nuhu, Parham M. Kebria, Vahid Hemmati, Mahmoud N. Mahmoud, Edward Tunstel, Abdollah Homaifar
arXiv:2609.22293v1 Announce Type: new
Abstract: Vision-language models (VLMs) and vision-language-action models (VLAs) are increasingly deployed in real-world applications. There, a small perturbatio...
By Bogdan Aron, Christopher Brix, Benedikt Br\"uckner, Yanghao Zhang, Panagiotis Kouvaros, Alessio Lomuscio
arXiv:2201. 01973v3 Announce Type: replace-cross Abstract: The problem of linear predictions has been extensively studied for the past century under pretty generalized frameworks.
By Saptarshi Chakraborty, Debolina Paul, Swagatam Das
arXiv:2606. 07593v1 Announce Type: cross Abstract: The widespread use of image classification models in high-risk, real-world situations necessitates making these models robust to slight disturbances or perturbations, such as blurring or sharpening, in the input images.
By Hannah Gao (Massachusetts Institute of Technology), Isha Agarwal (Massachusetts Institute of Technology), Dylan Hadfield-Menell (Massachusetts Institute of Technology), Rachel Ma (Massachusetts Institute of Technology)