arXiv:2605. 15212v2 Announce Type: replace-cross Abstract: We propose a new numerical method to estimate the fault tolerance of failure modes in digital circuit structures with a generative network sampling technique.
Summary generated by The Flow from the publisher's feed. The full article lives at arXiv AI.
arXiv:2508. 00472v2 Announce Type: replace Abstract: The tabular form constitutes the standard way of representing data in relational database systems and spreadsheets.
arXiv:2509. 24935v3 Announce Type: replace-cross Abstract: Scalability has driven recent advances in generative modeling, yet its principles remain underexplored for adversarial learning.
arXiv:2608. 10096v1 Announce Type: cross Abstract: Modern data science increasingly gives rise to hypothesis-testing problems that are not naturally formulated in terms of parameters within prespecified statistical models.
arXiv:2607. 19455v1 Announce Type: new Abstract: In bearing vibration datasets, most samples receive predicted fault probabilities close to 0 or 1, while samples with intermediate (gray-zone) probabilities are rare.
arXiv:2606. 02434v1 Announce Type: new Abstract: Precise parametric control over circuit geometry is essential for semiconductor inspection, yet obtaining sufficient real training data remains costly.
arXiv:2608. 04173v1 Announce Type: new Abstract: Deep neural networks (DNNs) deployed on resource-constrained neuromorphic hardware face three concurrent challenges: the need for model compression through pruning, vulnerability to adversarial input perturbations, and susceptibility to hardware-induced weight faults such as stuck-at-zero errors.