DEQ-Det: Dual Evidence Queries for Few-Shot Analog IC Device Detection
Read the original on arXiv Computer Vision →The Flow has not summarised this story yet — read it at arXiv Computer Vision.
The Flow has not summarised this story yet — read it at arXiv Computer Vision.
arXiv:2607. 12245v1 Announce Type: cross Abstract: Few-shot industrial defect detection remains difficult for standard supervised detectors, which achieve poor performance on boundary-dominated industrial defects.
arXiv:2608. 15802v1 Announce Type: cross Abstract: Out-of-distribution (OOD) detection remains challenging for image classifiers, especially when near-OOD samples lie close to in-distribution (ID) class boundaries.
arXiv:2608.23295v1 Announce Type: new Abstract: Memory-based anomaly detectors store nominal training patches and score test patches against this memory. A patch selected for coverage therefore becom...
Out-of-distribution (OOD) detection remains challenging for image classifiers, especially when near-OOD samples lie close to in-distribution (ID) class boundaries. Recent vision-language detectors imp...
arXiv:2608.30656v1 Announce Type: new Abstract: Proactive tamper localization embeds an imperceptible signal into an image prior to distribution, enabling pixel-level manipulation detection. Existing...
SPARC is a few‑shot calibration technique for vision‑based industrial anomaly detectors that corrects deployment‑time nuisances by projecting patch features onto a per‑cell subspace, requiring only up to eight verified‑normal images and no gradient updates. It operates between the encoder and detector, using a closed‑form, spatially indexed estimate based on the encoder’s native patch grid. Across seven detectors on shift‑prone benchmarks, SPARC boosts pooled Image AUROC by 13.8 pp and AU‑PRO₀.₃ by 3.5 pp, while showing modest changes on benchmarks without engineered shift.