The paper introduces a physics-informed self‑supervised learning framework that jointly calibrates wire gains and reconstructs interaction positions in Multi‑Wire Parallel Plate Avalanche Counters (MWPPACs) without labelled data or dedicated calibration runs. By treating calibration as a latent optimization problem, the method simultaneously estimates global wire gains and event‑wise positions using only detector geometry and charge‑energy consistency constraints. A detector‑independent neural network learns sub‑wire position reconstruction from local charge distributions, enabling continuous self‑calibration and improved spatial homogeneity and resolution, as demonstrated on the VAMOS++ spectrometer’s entrance MWPPACs.
By Antoine Lemasson, Maurycy Rejmund
arXiv:2507. 07109v2 Announce Type: cross Abstract: The VAMOS++ magnetic spectrometer is a multi-parametric system that integrates ion optical magnetic elements with a multi-detector stack.
By M. Rejmund, A. Lemasson
arXiv:2608. 16612v1 Announce Type: cross Abstract: An accurate estimation of the state of health (SOH) underpins a safe and optimized use of the battery system.
By Jiaqi Yao, Julia Kowal
arXiv:2511. 22246v2 Announce Type: replace-cross Abstract: Unsupervised learning has been widely applied to various tasks in particle physics.
By Xing-Jian Lv, De-Xing Miao, Zi-Jun Xu, Jian-Chun Wang
arXiv:2606. 03355v1 Announce Type: new Abstract: Physics models are inherently imperfect due to misspecified or missing mechanisms, resulting in systematic discrepancies between model predictions and real-world observations.
By Aishwarya Venkataramanan, Sai Karthikeya Vemuri, Joachim Denzler
The paper introduces SMART, a lightweight recalibration technique that adjusts logits based on the margin between the top two logits, called the logit gap. It uses a soft-binned Expected Calibration Error objective to balance bias and variance, enabling stable updates even with limited calibration data. Experiments across various datasets and architectures show SMART achieves state‑of‑the‑art calibration with fewer parameters than existing methods.
By Haolan Guo, Linwei Tao, Haoyang Luo, Minjing Dong, Chang Xu
arXiv:2607. 14486v1 Announce Type: cross Abstract: Machine-learning force fields (MLFFs) are reliable only near their training distribution, making efficient construction of diverse training sets a major bottleneck for both train-from-scratch and foundation fine-tuning workflows.
By Sheng Bi, Yi-Ze Wang, Jun Cheng
arXiv:2608. 11435v1 Announce Type: new Abstract: Forward and inverse modeling of parametric dynamical systems requires surrogate models that are not only accurate for state prediction, but also informative for parameter calibration.
By Qiyao Zhou, Xujia Zhu, Pierre Joli, Yu Cong, Sibo Cheng
arXiv:2607. 16864v1 Announce Type: new Abstract: Supercharging of lithium-ion batteries (LiBs) requires robust health monitoring to ensure durability, safety, and user confidence, particularly for emerging vehicle-to-grid applications with bidirectional energy flows.
By Wendi Guo, S{\o}ren Byg Vilsen, Daniel Ioan Stroe, Yaqi Li, Yicun Huang, Ashima Verma, Daniel Brandell
arXiv:2603. 29135v2 Announce Type: replace Abstract: Autonomous experimental systems are increasingly used in materials research to accelerate scientific discovery, but their performance is often limited by low-quality, noisy data.
By Jawad Chowdhury, Ganesh Narasimha, Jan-Chi Yang, Yongtao Liu, Rama Vasudevan
arXiv:2607. 18361v1 Announce Type: cross Abstract: Deep neural networks have become a promising approach for IMU-based sensing, but their scalability is fundamentally limited by costly labeled data and poor robustness to heterogeneous devices, placements, and users.
By Yuyang Leng (Richard), Renyuan Liu (Richard), Shaohan Hu (Richard), Peijun Zhao (Richard), Chun-Fu Chen (Richard), Songqing Chen, Shuochao Yao
arXiv:2604. 09787v2 Announce Type: replace-cross Abstract: Data collected from the physical world is always a combination of multiple sources: an underlying signal from the physical process of interest and a signal from measurement-dependent artifacts from the sensor or instrument.
By Pablo Mercader-Perez, Carolina Cuesta-Lazaro, Daniel Muthukrishna, Jeroen Audenaert, V. Ashley Villar, David W. Hogg, Marc Huertas-Company, William T. Freeman