arXiv Machine Learning By Angan Mukherjee, Tyler A. Soderstrom, Michael J. Kurtz, Victor M. Zavala

Topological Data Analysis for High-Dimensional Dynamic Process Monitoring

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arXiv:2606. 20443v1 Announce Type: cross Abstract: Real-time process monitoring requires methods that extract actionable information from high-dimensional time-series data.

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The operational integrity of complex industrial systems relies on precise anomaly detection and diagnosis. The vast majority of existing methods narrowly focus on capturing temporal similarities of representations, often overlooking the disruption of internal causal relationships, which characterizes system failures and latent anomalies.